Search Results - "Iriuchijima, Y"
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Cost of Ownership/Yield Enhancement of High Volume Immersion Lithography Using Topcoat-Less Resists
Published in IEEE transactions on semiconductor manufacturing (01-02-2012)“…The complexity and extra cost associated with a resist topcoat layer has motivated the industry to transition to topcoat-less (TC-less) resist processes. By…”
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Journal Article -
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Cost of Ownership/Yield Enhancement of High Volume Immersion Lithography Using Topcoat-Less Resists
Published in IEEE transactions on semiconductor manufacturing (01-05-2011)“…The complexity and extra cost associated with a resist topcoat (TC) layer has motivated the industry to transition to TC-less resist processes. By switching to…”
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Journal Article Conference Proceeding