Search Results - "Inkson, B. J."

In situ formation of 1D nanostructures from ceria nanoparticle dispersions by liquid cell TEM irradiation by Asghar, M. S. A., Inkson, B. J., Möbus, G.

“…Deliberate electron irradiation of cerium oxide nanoparticles in water is used to trigger chemical reactions in a liquid cell transmission electron microscope…”
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3D determination of grain shape in a FeAl-based nanocomposite by 3D FIB tomography by Inkson, B.J, Mulvihill, M, Möbus, G

“…The 3D shapes of individual grains in an extruded FeAl nanocomposite have been determined by a new method of 3D focused ion beam (FIB) tomographic analysis…”
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A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging by Dapor, Maurizio, Inkson, B. J, Rodenburg, C, Rodenburg, J. M

“…Two-dimensional dopant mapping using secondary electrons in a scanning electron microscope is a useful and rapid technique for studying dopant distributions…”
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Three-dimensional reconstruction of buried nanoparticles by element-sensitive tomography based on inelastically scattered electrons by Möbus, G., Inkson, B. J.

“…Energy-filtered transmission electron microscopy is used to image the nanocomposite FeAl+Y2O3, an oxide-dispersion-strengthened intermetallic alloy, over a…”
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Nanoscale Tribology, Energy Dissipation and Failure Mechanisms of Nano- and Micro-silica Particle-filled Polymer Composites by Devaprakasam, D, Hatton, P. V, Möbus, G, Inkson, B. J

“…Nanoscale energy dissipation and failure mechanics of silica nano- and micro-particle-filled polymer composite have been evaluated using advanced electron…”
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Quantitative dopant contrast in the helium ion microscope by Jepson, M. A. E, Inkson, B. J, Liu, Xiong, Scipioni, L, Rodenburg, C

“…As semiconductor devices shrink in size, the challenge of characterisation of their dopant distributions intensifies. Scanning electron microscopy (SEM) has…”
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Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.%SiC nanocomposites by Wu, H.Z, Roberts, S.G, Möbus, G, Inkson, B.J

“…TEM and 3D crack analysis by focused ion beam (FIB) cross sectioning have been used to quantify the subsurface damage beneath scratches made by a 120° cone…”
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Growth and microstructural stability of epitaxial Al films on (0001) α-Al2O3 substrates by DEHM, G, INKSON, B. J, WAGNER, T

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Dopant contrast in the helium ion microscope by Jepson, M. A. E, Inkson, B. J, Rodenburg, C, Bell, D. C

“…Due to miniaturisation of semiconductor devices, there is an increasing need for nanoscale characterisation of dopant distributions. Scanning electron…”
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Subsurface nanoindentation deformation of Cu–Al multilayers mapped in 3D by focused ion beam microscopy by Inkson, B. J., Steer, T., Möbus, G., Wagner, T.

“…A new technique for the three‐dimensional analysis of subsurface damage of nanocomposites is presented. Cu–Al multilayers, grown epitaxially on (0001)Al2O3…”
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Broadband conversion of microwaves into propagating spin waves in patterned magnetic structures by Mushenok, F. B., Dost, R., Davies, C. S., Allwood, D. A., Inkson, B. J., Hrkac, G., Kruglyak, V. V.

“…We have used time-resolved scanning Kerr microscopy and micromagnetic simulations to demonstrate that, when driven by the spatially uniform microwave field,…”
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Electron beam nanofabrication of ferromagnetic nanostructures in TEM by Gnanavel, T., Mat Yajid, M. A., Saghi, Z., Peng, Y., Inkson, B. J., Gibbs, M. R. J., Möbus, G.

“…Electron beam (e-beam) fabrication of nanostructures by transmission electron microscopy (TEM) is rapidly developing into a top-down nanofabrication method for…”
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Dislocations and twinning activated by the abrasion of Al2O3 by INKSON, B. J

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Indentation mechanics of Cu–Be quantified by an in situ transmission electron microscopy mechanical probe by Bobji, M.S., Pethica, J.B., Inkson, B.J.

“…In situ transmission electron microscopy was used to study, in real time, the sub-surface deformation taking place in Cu–Be alloy during nanoindentation. A…”
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3-D focused ion beam mapping of nanoindentation zones in a Cu–Ti multilayered coating by Steer, T.J., Möbus, G., Kraft, O., Wagner, T., Inkson, B.J.

“…The 3-D deformation of metal multilayers under nanoindentation sites has been evaluated using the method of 3-D focused ion beam mapping. 3-D maps of both…”
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Effect of annealing on the electrical and magnetic properties of electrodeposited Ni and permalloy nanowires by Dost, R., Zhou, Y., Zhang, H., Allwood, D.A., Inkson, B.J.

“…•The conductivity of electro-deposited Ni nanowires can be doubled through annealing.•This mechanism works through changes in the material's crystal…”
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In situ TEM observation of dislocation motion in thermally strained Al nanowires by Inkson, B.J, Dehm, G, Wagner, T

“…Al thin films deposited epitaxially on (0001) α-Al 2O 3 substrates, have been thinned cross-sectionally to form Al nanowires. The Al wires, consisting of two…”
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Multilayer nitride coatings by closed field unbalanced magnetron sputter ion plating by Cooke, K.E., Bamber, M., Bassas, J., Boscarino, D., Derby, B., Figueras, A., Inkson, B.J., Rigato, V., Steer, T., Teer, D.G.

“…A range of ceramic multilayer nitride coatings, including Nb x Ti y N, Nb x Zr y N, and Mo x Zr y N, has been successfully deposited onto tool and die steels…”
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Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam by INKSON, B. J., DEHM, G., WAGNER, T.

“…Summary Ti and Pt nanowires have been produced by ultra high‐vacuum molecular beam epitaxy deposition of Ti thin films and focused ion beam (FIB) deposition of…”
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Spontaneous formation of the B2 phase from a decagonal quasicrystal under reduced constraint by KIM, S. H, CHATTOPADHYAY, K, INKSON, B. J, MÖBUS, G, KIM, W. T, KIM, D. H

“…Since the discovery that vacancies can quasiperiodically order in a basic B2 structure to yield a one-dimensional quasiperiodicity, these phases were subjected…”
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