Search Results - "I. V. Schemerov"
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Optimization of the Transient Characteristics of the Rectifiers under High-Energy Electron Irradiation
Published in Instruments and experimental techniques (New York) (01-06-2024)“…It is shown that capacitance–frequency characterization can help to derive the optimization limits for radiation optimization of the transient properties of…”
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Study of the Abnormally High Photocurrent Relaxation Time in α-Ga2O3-Based Schottky Diodes
Published in Russian microelectronics (01-12-2023)“…Ga 2 O 3 is a wide-bandgap material with a number of unique characteristics that make it a promising material for photonics: it is optically transparent to…”
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On the Problem of Determining the Bulk Lifetime by Photoconductivity Decay on the Unpassivated Samples of Monocrystalline Silicon
Published in Russian microelectronics (01-12-2017)“…In the indirect band gap semiconductors, and in particular, in silicon, the lifetime of nonequilibrium charge carriers is determined by recombination through…”
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A device for free-carrier recombination lifetime measurements
Published in Instruments and experimental techniques (New York) (01-05-2016)“…The design of a microwave system, the user interface, and the basic characteristics of noncontact equipment for measuring the recombination lifetime of free…”
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5
Reference samples of the silicon single crystalls free carrier recombination lifetime
Published in Standartnye Obrazcy (01-05-2017)“…A comparison of two methods for measurement of the free carrier recombination lifetime in the unpassivated samples of high resistivity n-type silicon single…”
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