Search Results - "Hyung-Suk Jung"

Toward Advanced High‐ k and Electrode Thin Films for DRAM Capacitors via Atomic Layer Deposition by Kim, Se Eun, Sung, Ju Young, Jeon, Jae Deock, Jang, Seo Young, Lee, Hye Min, Moon, Sang Mo, Kang, Jun Goo, Lim, Han Jin, Jung, Hyung‐Suk, Lee, Sang Woon

“…Dynamic random access memories (DRAMs) are currently used as the core memory in computing systems because of their high speed and density. Their demand should…”
Get full text

Evaluation of the Ultimate Strength of the Ultra-High-Performance Fiber-Reinforced Concrete Beams by Bae, Baek-Il, Lee, Moon-Sung, Choi, Chang-Sik, Jung, Hyung-Suk, Choi, Hyun-Ki

“…Evaluation of the ultimate strength for the UHPFRC (ultra-high-performance fiber-reinforced concrete) flexural members was conducted. In this study, an…”
Get full text

Flexural Strength and Stiffness of Donut-Type Voided Slab by Chung, Joo-Hong, Jung, Hyung-Suk, Choi, Hyun-Ki

“…The voided slab system has been known as an effective technique to replace a heavy reinforced concrete slab system without the decrease in flexural strength…”
Get full text

Bond Characteristics of a Deformed Steel Bar Embedded in Donut-Type Voided Slab by Chung, Joo-Hong, Jung, Hyung-Suk, Choi, Hyun-Ki

“…In reinforced concrete (RC) structures, bond behavior between concrete and deformed steel bar (rebar) has a great effect on the structural behavior of members…”
Get full text

Ferroelectric modulation of terahertz waves with graphene/ultrathin-Si:HfO2/Si structures by Jiang, Ran, Han, Zuyin, Sun, Weideng, Du, Xianghao, Wu, Zhengran, Jung, Hyung-Suk

“…Ferroelectric-field-effect-tunable modulation of terahertz waves in graphene/Si:HfO2/Si stack structure was observed. The modulation shows distinct behaviors…”
Get full text

Study of Metal–Dielectric Interface for Improving Electrical Properties and Reliability of DRAM Capacitor by Lim, HanJin, Choi, Jae Hyoung, Cho, Gihee, Chang, Jaewan, Kim, Younsoo, Jung, Hyung‐Suk, Shin, Kyoung‐Sub, Seo, Hyungtak, Jeon, Hyeongtag

“…The interface between a dielectric thin film and a metal electrode is studied to improve reliability as well as electrical properties of the…”
Get full text

Two-Way Flexural Behavior of Donut-Type Voided Slabs by Chung, Joo-Hong, Jung, Hyung-Suk, Bae, Baek-il, Choi, Chang-Sik, Choi, Hyun-Ki

“…Voided slab systems were developed using segmented void formers such as spherical or oval plastic balls for two-way slab applications. This type of slab is…”
Get full text

Interfacial engineering of ZrO2 metal-insulator-metal capacitor using Al2O3/TiO2 buffer layer for improved leakage properties by Shin, Heecheol, Choi, Hyobin, Lim, Jaeseong, Lee, Wanggon, Mohit, Kumar, Kim, Younsoo, Jung, Hyung-Suk, Lim, Hanjin, Seo, Hyungtak

“…The continuous scale-down of dynamic random-access memory (DRAM) requires shrinkage of high aspect ratio metal-insulator-metal (MIM) capacitance along with the…”
Get full text

Experimental and Numerical Study on the Compression Behavior of Square Concrete-Filled Steel Tube Stub Columns with Steel Fiber-Reinforced High-Strength Concrete by Choi, Chang Sik, Chung, Joo-Hong, Choi, Hyun-Ki, Bae, Baek-Il, Jung, Hyung-Suk, Choi, Yun-Cheul

“…This study was conducted to evaluate the applicability of concrete-filled steel tube (CFT) columns made from high-performance construction materials. KBC2016,…”
Get full text

Growth and electrical properties of silicon oxide grown by atomic layer deposition using Bis(ethyl-methyl-amino)silane and ozone by Won, Seok-Jun, Jung, Hyung-Suk, Suh, Sungin, Jin Choi, Yu, Lee, Nae-In, Seong Hwang, Cheol, Joon Kim, Hyeong

“…Silicon oxide thin film grown at low temperatures (<300–500 °C) is essential for a range of applications in semiconductor devices. In this study, silicon oxide…”
Get full text

Contribution of Interface States and Oxide Traps to the Negative Bias Temperature Instability of High- k pMOSFETs by JO, Minseok, MAN CHANG, KIM, Seonghyun, JUNG, Hyung-Suk, CHOI, Rino, HWANG, Hyunsang

“…Negative bias temperature instability (NBTI) in MOSFETs with high-dielectric-constant ( k ) gate dielectrics has been investigated using a novel pulse NBTI…”
Get full text

Oxygen vacancy induced charge trapping and positive bias temperature instability in HfO2nMOSFET by Jo, Minseok, Park, Hokyung, Chang, Man, Jung, Hyung-Suk, Lee, Jong-Ho, Hwang, Hyunsang

“…The charge trapping and positive bias temperature instability (PBTI) are investigated at different post deposition annealing conditions (PDA) in HfO2 nMOSFET…”
Get full text

Experimental study on the cyclic behavior of steel fiber reinforced high strength concrete columns and evaluation of shear strength by Bae, Baek-Il, Chung, Joo-Hong, Choi, Hyun-Ki, Jung, Hyung-Suk, Choi, Chang-Sik

“…•Performance increase of high strength reinforced concrete columns by inclusion of steel fiber.•Crack control and decrease of crack angle according to the…”
Get full text

Evaluation of punching shear strength of voided slabs considering the effect of the ratio b0/d by Chung, Joo-Hong, Bae, Baek-Il, Choi, Hyun-Ki, Jung, Hyung-Suk, Choi, Chang-Sik

“…•Test results of punching shear strength of voided slabs.•Numerical investigation of the punching shear strength of voided slab.•Punching shear strength…”
Get full text

Stabilization of Tetragonal HfO2 under Low Active Oxygen Source Environment in Atomic Layer Deposition by Cho, Deok-Yong, Jung, Hyung Suk, Yu, Il-Hyuk, Yoon, Jung Ho, Kim, Hyo Kyeom, Lee, Sang Young, Jeon, Sang Ho, Han, Seungwu, Kim, Jeong Hwan, Park, Tae Joo, Park, Byeong-Gyu, Hwang, Cheol Seong

“…The structural and electronic properties of HfO2 thin films grown by atomic layer deposition (ALD) under various ozone concentrations were investigated using…”
Get full text

Nondestructive investigation of interface states in high-k oxide films on Ge substrate using X-ray absorption spectroscopy by Cho, Deok-Yong, Jung, Hyung-Suk, Yu, Il-Hyuk, Park, Won Goo, Cho, Suyeon, Kim, Useong, Oh, Se-Jung, Park, Byeong-Gyu, Chang, Fan-Hsiu, Lin, Hong-Ji, Hwang, Cheol Seong

“…The unoccupied electronic structures of 5 nm thick high permittivity (k) oxides (HfO2, ZrO2, and Al2O3) and SiO2 films on Ge substrates were examined using O…”
Get full text

Effect of Oxygen Postdeposition Annealing on Bias Temperature Instability of Hafnium Silicate MOSFET by JO, Minseok, PARK, Hokyung, LEE, Joon-Myoung, MAN CHANG, JUNG, Hyung-Suk, LEE, Jong-Ho, HWANG, Hyunsang

“…Bias temperature instability (BTI) characteristics depending on postdeposition anneal (PDA) conditions were studied using dc (slow process) and pulse (fast…”
Get full text

Reduction of Electrical Defects in Atomic Layer Deposited HfO2 Films by Al Doping by Park, Tae Joo, Kim, Jeong Hwan, Jang, Jae Hyuck, Lee, Choong-Ki, Na, Kwang Duk, Lee, Sang Young, Jung, Hyung-Suk, Kim, Miyoung, Han, Seungwu, Hwang, Cheol Seong

“…The gate leakage current density (J g) of ultrathin (∼3 nm) Al-doped HfO2 (Al:HfO2) films with an Al concentration of ∼11% was lower than that of the control…”
Get full text

Monocliniclike local atomic structure in amorphous ZrO2 thin film by Cho, Deok-Yong, Jung, Hyung-Suk, Kim, Jeong Hwan, Hwang, Cheol Seong

“…The local atomic structure and electronic structure of amorphous ZrO2 (a-ZrO2) thin film were examined using the Zr K- and O K-edge x-ray absorption…”
Get full text

Improving the Electrical Properties of Lanthanum Silicate Films on Ge Metal Oxide Semiconductor Capacitors by Adopting Interfacial Barrier and Capping Layers by Choi, Yu Jin, Lim, Hajin, Lee, Suhyeong, Suh, Sungin, Kim, Joon Rae, Jung, Hyung-Suk, Park, Sanghyun, Lee, Jong Ho, Kim, Seong Gyeong, Hwang, Cheol Seong, Kim, HyeongJoon

“…The electrical properties of La-silicate films grown by atomic layer deposition (ALD) on Ge substrates with different film configurations, such as various Si…”
Get full text