Search Results - "Hwan-Kuk Yuh"

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  1. 1

    Experimental determination of current spill-over and its effect on the efficiency droop in InGaN/GaN blue-light-emitting-diodes by Ahn, Byung-Jun, Kim, Tae-Soo, Dong, Yanqun, Hong, Moon-Taek, Song, Jung-Hoon, Song, Jae-Ho, Yuh, Hwan-Kuk, Choi, Sung-Chul, Bae, Duk-Kyu, Moon, Youngboo

    Published in Applied physics letters (16-01-2012)
    “…We report the experimental determination of current spill-over in InGaN/GaN blue light emitting diodes by measuring the change in the forward current generated…”
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    Journal Article
  2. 2

    Role of photovoltaic effects on characterizing emission properties of InGaN/GaN light emitting diodes by Song, Jae-Ho, Kim, Ho-Jong, Ahn, Byung-Jun, Dong, Yanqun, Hong, Sayong, Song, Jung-Hoon, Moon, Youngboo, Yuh, Hwan-Kuk, Choi, Sung-Chul, Shee, Sangkee

    Published in Applied physics letters (28-12-2009)
    “…Strong photovoltaic effects on photoluminescence (PL) spectra in InGaN/GaN blue light emitting diodes were investigated. Due to severe carrier escape from…”
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    Journal Article
  3. 3

    Effects of strain-control layers on piezoelectric field and indium incorporation in InGaN/GaN blue quantum wells by Song, Jae-Ho, Dong, Yanqun, Kim, Ho-Jong, Ahn, Byung-Jun, Kim, Tae-Soo, Hong, Soon-Ku, Yuh, Hwan-Kuk, Choi, Sung-Chul, Moon, Youngboo, Shee, Sangkee, Lee, Jae-Hak, Song, Jung-Hoon

    “…We investigated the effects of a strain‐control layer on piezoelectric fields and indium incorporation in blue‐emitting InGaN/GaN quantum wells (QWs) using…”
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    Journal Article
  4. 4

    Well-to-well non-uniformity in InGaN/GaN multiple quantum wells characterized by capacitance-voltage measurement with additional laser illumination by Kim, Tae-Soo, Ahn, Byung-Jun, Dong, Yanqun, Park, Ki-Nam, Lee, Jin-Gyu, Moon, Youngboo, Yuh, Hwan-Kuk, Choi, Sung-Chul, Lee, Jae-Hak, Hong, Soon-Ku, Song, Jung-Hoon

    Published in Applied physics letters (13-02-2012)
    “…We experimentally investigated well-to-well non-uniformity in InGaN/GaN multiple quantum well (MQW) structures by using capacitance-voltage measurements with…”
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    Journal Article
  5. 5

    EFFECTS OF Pb/Pt TOP ELECTRODE ON HYDROGEN-INDUCED DEGRADATION IN Pb(Zr,Ti)O3 by Yuh, H-K, Yoon, E, Lee, Y T, Park, Y W, Lee, S I

    “…H-induced ferroelectric degradation of Pb(Zr,Ti)O3 (PZT) films was studied by measuring the hysteresis curves after H annealing at various temperatures and…”
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    Journal Article
  6. 6

    Effects of prestrained layers on piezoelectric field and indium incorporation in InGaN/GaN quantum wells by Jae-Ho Song, Ho-Jong Kim, Byung-Jun An, Jung-Hoon Song, Youngboo Moon, Hwan-Kuk Yuh, Sung-Chul Choi

    “…We investigated the effects of prestrained layers on piezoelectric fields and indium incorporation in blue-emitting InGaN/GaN quantum wells by using…”
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    Conference Proceeding
  7. 7

    A dual side electroluminescence measurement system for LED wafer manufacturing by Kim, H. T., Kim, J., Kim, S. T., Hwan-Kuk Yuh, Dae-Hoon Kim, Ahn, D. H.

    “…The development of a system that evaluates the performances of an LED (light-emitting diode) wafer using a non-destructive test method after crystal growth and…”
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    Conference Proceeding
  8. 8

    Role of photovoltaic effects on characterizing emission propertiesof InGaN/GaN light emitting diodes by Song, Jae-Ho, Kim, Ho-Jong, Ahn, Byung-Jun, Dong, Yanqun, Hong, Sayong, Song, Jung-Hoon, Moon, Youngboo, Yuh, Hwan-Kuk, Choi, Sung-Chul, Shee, Sangkee

    Published in Applied physics letters (30-12-2009)
    “…Strong photovoltaic effects on photoluminescence (PL) spectra in InGaN/GaN blue light emitting diodes were investigated. Due to severe carrier escape from…”
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    Journal Article
  9. 9

    Low-temperature Si epitaxial growth on oxide patterned wafers by ultrahigh vacuum electron cyclotron resonance chemical vapor deposition by Yuh, Hwan-Kuk, Park, Jin-Won, Lim, Seung-Hyun, Hwang, Ki-Hyun, Yoon, Euijoon

    “…Low-temperature electron cyclotron resonance hydrogen plasma cleaning was developed for low-temperature epitaxial growth of Si by ultrahigh vacuum electron…”
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    Journal Article
  10. 10