Search Results - "Hussin, Razaidi"

Speed and area analysis on hierarchy multiplier by Wong, Moon Cheng, Hussin, Razaidi

“…This paper proposes designs of hierarchy multiplier by utilising different designs on 4:2 and 7:3 compressor and multiple compressors. The hierarchy…”
Get full text

FPGA-based protein sequence alignment : A review by Md. Isa, Mohd. Nazrin, Ku Muhsen, Ku Noor Dhaniah, Saiful Nurdin, Dayana, Ahmad, Muhammad Imran, Zainol Murad, Sohiful Anuar, Mohyar, Shaiful Nizam, Harun, Azizi, Hussin, Razaidi

“…Sequence alignment have been optimized using several techniques in order to accelerate the computation time to obtain the optimal score by implementing…”
Get full text

Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM by Jidin, Aiman Zakwan, Hussin, Razaidi, Fook, Lee Weng, Mispan, Mohd Syafiq, Zakaria, Nor Azura, Ying, Loh Wan, Zamin, Norshuhani

“…Memory BIST implements March test techniques extensively for testing embedded memories on a chip. A high-complexity test algorithm like the March MSS (18N) can…”
Get full text

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization by Gerrer, Louis, Brown, Andrew R., Millar, Campbell, Hussin, Razaidi, Amoroso, Salvatore Maria, Binjie Cheng, Reid, Dave, Alexander, Craig, Fried, David, Hargrove, Michael, Greiner, Ken, Asenov, Asen

“…In this paper we illustrate how the predictive Technology Computer Aided Design (TCAD) process device simulation can be used to evaluate process, statistical,…”
Get full text

A statistical study of time dependent reliability degradation of nanoscale mosfet devices by Hussin, Razaidi

“…Charge trapping at the channel interface is a fundamental issue that adversely affects the reliability of metal-oxide semiconductor field effect transistor…”
Get full text

Modeling Carrier Mobility in Nano-MOSFETs in the Presence of Discrete Trapped Charges: Accuracy and Issues by Amoroso, Salvatore Maria, Gerrer, Louis, Nedjalkov, Mihail, Hussin, Razaidi, Alexander, Craig, Asenov, Asen

“…This paper investigates the accuracy and issues of modeling carrier mobility in the channel of a nanoscaled MOSFET in the presence of discrete charges trapped…”
Get full text

Time-Dependent 3-D Statistical KMC Simulation of Reliability in Nanoscale MOSFETs by Amoroso, Salvatore Maria, Gerrer, Louis, Hussin, Razaidi, Adamu-Lema, Fikru, Asenov, Asen

“…This paper presents a thorough numerical investigation of statistical effects associated with charge trapping dynamics and their impact on the reliability…”
Get full text

Review of energy efficient block-matching motion estimation algorithms for wireless video sensor networks by Cheong Seong Chee, Jambek, Asral Bahari, Hussin, Razaidi

“…This paper reviews the energy efficiency of several popular block-matching motion estimation algorithms that can be used in wireless video sensor network…”
Get full text

Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations by Hussin, Razaidi, Amoroso, Salvatore Maria, Gerrer, Louis, Kaczer, Ben, Weckx, Pieter, Franco, Jacopo, Vanderheyden, Annelies, Vanhaeren, Danielle, Horiguchi, Naoto, Asenov, Asen

“…This paper presents an extensive study of the interplay between as-fabricated (time-zero) variability and gate oxide reliability (time-dependent variability)…”
Get full text

Experimental evidences and simulations of trap generation along a percolation path by Gerrer, Louis, Hussin, Razaidi, Amoroso, Salvatore M., Franco, J., Weckx, P., Simicic, M., Horiguchi, N., Kaczer, Ben, Grasser, T., Asenov, Asen

“…In this paper we present experimental results of single trap impact on bulk MOSFETs, shedding light on counter intuitive behavior when increasing the gate…”
Get full text

Reliability aware simulation flow: From TCAD calibration to circuit level analysis by Hussin, Razaidi, Vanhaeren, Danielle, Horiguchi, Naoto, Kaczer, Ben, Asenov, Asen, Gerrer, Louis, Ding, Jie, Amaroso, Salvatore Maria, Wang, Liping, Semicic, Marco, Weckx, Pieter, Franco, Jacopo, Vanderheyden, Annelies

“…In this paper, we present a simulation flow based on TCAD model calibration against experimental transistor measurement and doping profile reverse engineering…”
Get full text

Comparator Design Resistance Mitigation by using Cadence Virtuoso Tools in 45 Nanometer Process Technology by Syn Yi, Michelle Ang, Hussin, Razaidi, Rokhani, Fakhrul Zaman

“…This paper presents the resistance mitigation techniques for comparator design. Resistance plays an important role to semiconductor field. If resistance value…”
Get full text

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow by Hussin, Razaidi, Franco, Jacopo, Vanderheyden, Annelies, Vanhaeren, Danielle, Horiguchi, Naoto, Kaczer, Ben, Asenov, Asen, Gerrer, Louis, Ding, Jie, Wang, Liping, Amoroso, Salvatore M., Cheng, Binjie, Reid, Dave, Weckx, Pieter, Simicic, Marco

“…This work present the last development of a statistical reliability aware simulation flow from transistors to circuits. A TCAD calibration methodology based on…”
Get full text

Automated Fault Analyzer for March Algorithm Dynamic Fault Detection Analysis by Ying, Loh Wan, Hussin, Razaidi, Ahmad, Norhawati, Fook, Lee Weng, Jidin, Aiman Zakwan

“…Dynamic fault coverages of March test algorithms need to be analyzed to ensure the robustness of Memory BIST for dynamic fault detection. Dynamic faults are…”
Get full text

Modified March MSS for Unlinked Dynamic Faults Detection by Ying, Loh Wan, Hussin, Razaidi, Ahmad, Norhawati, Fook, Lee Weng, Jidin, Aiman Zakwan

“…Dynamic faults detection is important in recent Random Access Memory (RAM) technologies. However, there is less research performed to design memory test…”
Get full text

An Automation Program for March Algorithm Fault Detection Analysis by Jidin, Aiman Zakwan, Hussin, Razaidi, Fook, Lee Weng, Mispan, Mohd Syafiq

“…The efficiency of a Memory BIST for embedded memory testing depends on the fault coverage of the implemented test algorithm. A fault simulator is necessary to…”
Get full text

Reduced March SR Algorithm for Deep-Submicron SRAM Testing by Jidin, Aiman Zakwan, Hussin, Razaidi, Mispan, Mohd Syafiq, Fook, Lee Weng, Ying, Loh Wan

“…Memory Built-In Self-Test (BIST) is a common method to test embedded memories on a chip owing to its fast and low-cost testing. Its efficiency depends on the…”
Get full text

Hardware Design of Combinational 128-bit Camellia Symmetric Cipher using 0.18µm Technology by Sak, Chawalit Udom, Naziri, Siti Zarina Md, Ismail, Rizalafande Che, Isa, Mohd Nazrin Md, Hussin, Razaidi

“…Camellia is another symmetric key block cipher with a 128-bit block size and key sizes of 128, 192, and 256 bits. As the hardware version of cipher…”
Get full text

Novel March Test Algorithm Optimization Strategy for Improving Unlinked Faults Detection by Jidin, Aiman Zakwan, Hussin, Razaidi, Mispan, Mohd Syafiq, Fook, Lee Weng

“…March-series test algorithms have proven to be popular choices for Memory BIST implementation, owing to their simplicity yet having a good fault coverage…”
Get full text

Machine Control via Real Time Eye Detector by Wong, Pei Yan, Hussin, Razaidi, Md Isa, Mohd Nazrin

“…As the population ages, the number of people dependent on others who are paralyzed or losing their self-movement is increasing. This paper is focusing on the…”
Get full text