Search Results - "Hung, B.F."
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HfAlON n-MOSFETs incorporating low-work function gate using ytterbium silicide
Published in IEEE electron device letters (01-06-2006)“…The authors have fabricated low-temperature fully silicided YbSi/sub 2-x/-gated n-MOSFETs that used an HfAlON gate dielectric with a 1.7-nm EOT. After a 600…”
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Low noise RF MOSFETs on flexible plastic substrates
Published in IEEE electron device letters (01-07-2005)“…We report a low minimum noise figure (NF min ) of 1.1 dB and high associated gain (12 dB at 10 GHz) for 16 gate-finger 0.18-μm RF MOSFETs, after thinning down…”
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High-performance poly-silicon TFTs incorporating LaAlO/sub 3/ as the gate dielectric
Published in IEEE electron device letters (01-06-2005)“…We have integrated a high-/spl kappa/ LaAlO/sub 3/ dielectric into low-temperature poly-Si (LTPS) thin-film transistors (TFTs). Good TFT performance was…”
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Journal Article -
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Very low noise RF nMOSFETs on plastic by substrate thinning and wafer transfer
Published in IEEE microwave and wireless components letters (01-11-2005)“…A very low minimum noise figure (NF min ) of 1.2 dB and a high associated gain of 12.8 dB at 10 GHz were measured for six-finger, 0.18-μm radio frequency (RF)…”
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The corrective criteria to avoid adjacent segment degeneration following surgical correction for lumbar spondylolisthesis
Published in Brain & spine (2023)Get full text
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Surgical strategy-oriented classification for the patients with severe dynamic sagittal imbalance
Published in Brain & spine (2023)Get full text
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High-performance poly-silicon TFTs incorporating LaAlO3 as the gate dielectric
Published in IEEE electron device letters (01-06-2005)Get full text
Journal Article -
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HfSiON n-MOSFETs Using Low-Work Function hboxHfSixGate
Published in IEEE electron device letters (01-09-2006)“…The authors have developed a novel high-temperature stable HfSi x gate for high-kappa HfSiON gate dielectric. After a 1000 degC RTA, the HfSi x /HfSiON devices…”
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HfSiON n-MOSFETs Using Low-Work Function$hboxHfSi_x$Gate
Published in IEEE electron device letters (01-09-2006)Get full text
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High work function Ir/sub x/Si gates on HfAlON p-MOSFETs
Published in IEEE electron device letters (01-02-2006)“…We have fabricated the fully silicided Ir/sub x/Si-gated p-MOSFETs on HfAlON gate dielectric with 1.7-nm equivalent oxide thickness. After 950/spl deg/C rapid…”
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High-temperature stable HfLaON p-MOSFETs with high-work-function Ir3Si gate
Published in IEEE electron device letters (01-04-2007)Get full text
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High work function IrxSi gates on HfAlON p-MOSFETs
Published in IEEE electron device letters (01-02-2006)Get full text
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A novel program-erasable high-[kappa] AlN-Si MIS capacitor
Published in IEEE electron device letters (01-03-2005)Get full text
Journal Article -
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HfSiON n-MOSFETs Using Low-Work Function Gate
Published in IEEE electron device letters (01-09-2006)“…The authors have developed a novel high-temperature stable HfSi sub(x) gate for high-kappa HfSiON gate dielectric. After a 1000 degC RTA, the HfSi…”
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High-Temperature Stable HfLaON p-MOSFETs With High-Work-Function \hbox\hbox Gate
Published in IEEE electron device letters (01-04-2007)“…We report a novel 1000 degC stable HfLaON p-MOSFET with Ir 3 Si gate. Low leakage current of 1.8times10 -5 A/cm 2 at 1 V above flat-band voltage, good…”
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Strain-induced very low noise RF MOSFETs on flexible plastic substrate
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)“…Using microstrip line design to screen substrate resistance generated RF noise, very low 1.1 dB min. noise figure (NF/sub min/) and high 12 dB associate gain…”
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Conference Proceeding -
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Low workfunction fully silicided gate on SiO/sub 2//Si and LaAlO/sub 3//GOI n-MOSFETs
Published in Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC (2004)“…The main challenges for metal-gate/high-k CMOS are to find dual workfunction gates and robust high-k dielectrics. The low workfunction metal-gate for n-MOS is…”
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Conference Proceeding -
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A novel program-erasable high-/spl kappa/ AlN-Si MIS capacitor
Published in IEEE electron device letters (01-03-2005)“…We demonstrate a programmable-erasable MIS capacitor with a single layer high-/spl kappa/ AlN dielectric on Si having a high capacitance density of /spl sim/5…”
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Journal Article -
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High Temperature Stable [Ir3Si-TaN]/HfLaON CMOS with Large Work-Function Difference
Published in 2006 International Electron Devices Meeting (01-12-2006)“…The authors report novel 1000degC-stable [Ir 3 Si-TaN]/HfLaON CMOS for the first time, where the self-aligned and gate-first process are full compatible to…”
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Conference Proceeding