Search Results - "Hung, B.F."

Refine Results
  1. 1

    HfAlON n-MOSFETs incorporating low-work function gate using ytterbium silicide by Wu, C.H., Hung, B.F., Chin, A., Wang, S.J., Yen, F.Y., Hou, Y.T., Jin, Y., Tao, H.J., Chen, S.C., Liang, M.S.

    Published in IEEE electron device letters (01-06-2006)
    “…The authors have fabricated low-temperature fully silicided YbSi/sub 2-x/-gated n-MOSFETs that used an HfAlON gate dielectric with a 1.7-nm EOT. After a 600…”
    Get full text
    Journal Article
  2. 2

    Low noise RF MOSFETs on flexible plastic substrates by Kao, H.L., Chin, A., Hung, B.F., Lee, C.F., Lai, J.M., McAlister, S.P., Samudra, G.S., Won Jong Yoo, Chi, C.C.

    Published in IEEE electron device letters (01-07-2005)
    “…We report a low minimum noise figure (NF min ) of 1.1 dB and high associated gain (12 dB at 10 GHz) for 16 gate-finger 0.18-μm RF MOSFETs, after thinning down…”
    Get full text
    Journal Article
  3. 3

    High-performance poly-silicon TFTs incorporating LaAlO/sub 3/ as the gate dielectric by Hung, B.F., Chiang, K.C., Huang, C.C., Chin, A., McAlister, S.P.

    Published in IEEE electron device letters (01-06-2005)
    “…We have integrated a high-/spl kappa/ LaAlO/sub 3/ dielectric into low-temperature poly-Si (LTPS) thin-film transistors (TFTs). Good TFT performance was…”
    Get full text
    Journal Article
  4. 4

    Very low noise RF nMOSFETs on plastic by substrate thinning and wafer transfer by Kao, H.L., Hung, B.F., Chin, A., Lai, J.M., Lee, C.F., McAlister, S.P., Chi, C.C.

    “…A very low minimum noise figure (NF min ) of 1.2 dB and a high associated gain of 12.8 dB at 10 GHz were measured for six-finger, 0.18-μm radio frequency (RF)…”
    Get full text
    Journal Article
  5. 5
  6. 6
  7. 7
  8. 8
  9. 9

    HfSiON n-MOSFETs Using Low-Work Function hboxHfSixGate by Wu, C.H., Hung, B.F., Chin, A., Wang, S.J., Yen, F.Y., Hou, Y.T., Jin, Y., Tao, H.J., Chen, S.C., Liang, M.S.

    Published in IEEE electron device letters (01-09-2006)
    “…The authors have developed a novel high-temperature stable HfSi x gate for high-kappa HfSiON gate dielectric. After a 1000 degC RTA, the HfSi x /HfSiON devices…”
    Get full text
    Journal Article
  10. 10
  11. 11

    High work function Ir/sub x/Si gates on HfAlON p-MOSFETs by Wu, C.H., Yu, D.S., Chin, A., Wang, S.J., Li, M.-F., Zhu, C., Hung, B.F., McAlister, S.P.

    Published in IEEE electron device letters (01-02-2006)
    “…We have fabricated the fully silicided Ir/sub x/Si-gated p-MOSFETs on HfAlON gate dielectric with 1.7-nm equivalent oxide thickness. After 950/spl deg/C rapid…”
    Get full text
    Journal Article
  12. 12
  13. 13
  14. 14
  15. 15

    HfSiON n-MOSFETs Using Low-Work Function Gate by Wu, C.H, Hung, B.F, Chin, A, Wang, S.J, Yen, F.Y, Hou, Y.T, Jin, Y, Tao, H.J, Chen, S.C, Liang, M.S

    Published in IEEE electron device letters (01-09-2006)
    “…The authors have developed a novel high-temperature stable HfSi sub(x) gate for high-kappa HfSiON gate dielectric. After a 1000 degC RTA, the HfSi…”
    Get full text
    Journal Article
  16. 16

    High-Temperature Stable HfLaON p-MOSFETs With High-Work-Function \hbox\hbox Gate by Wu, C.H., Hung, B.F., Chin, A., Wang, S.J., Wang, X.P., Li, M.-F., Zhu, C., Yen, F.Y., Hou, Y.T., Jin, Y., Tao, H.J., Chen, S.C., Liang, M.S.

    Published in IEEE electron device letters (01-04-2007)
    “…We report a novel 1000 degC stable HfLaON p-MOSFET with Ir 3 Si gate. Low leakage current of 1.8times10 -5 A/cm 2 at 1 V above flat-band voltage, good…”
    Get full text
    Journal Article
  17. 17

    Strain-induced very low noise RF MOSFETs on flexible plastic substrate by Kao, H.L., Chin, A., Hung, B.F., Lai, J.M., Lee, C.F., Li, M.-F., Samudra, G.S., Zhu, C., Xia, Z.L., Liu, X.Y., Kang, J.F.

    “…Using microstrip line design to screen substrate resistance generated RF noise, very low 1.1 dB min. noise figure (NF/sub min/) and high 12 dB associate gain…”
    Get full text
    Conference Proceeding
  18. 18

    Low workfunction fully silicided gate on SiO/sub 2//Si and LaAlO/sub 3//GOI n-MOSFETs by Yu, D.S., Chin, A., Hung, B.F., Chen, W.J., Zhu, C.X., Li, M.-F., Zhu, S.Y., Kwong, D.L.

    “…The main challenges for metal-gate/high-k CMOS are to find dual workfunction gates and robust high-k dielectrics. The low workfunction metal-gate for n-MOS is…”
    Get full text
    Conference Proceeding
  19. 19

    A novel program-erasable high-/spl kappa/ AlN-Si MIS capacitor by Lai, C.H., Chin, A., Hung, B.F., Cheng, C.F., Won Jong Yoo, Li, M.F., Chunxiang Zhu, McAlister, S.P., Dim-Lee Kwong

    Published in IEEE electron device letters (01-03-2005)
    “…We demonstrate a programmable-erasable MIS capacitor with a single layer high-/spl kappa/ AlN dielectric on Si having a high capacitance density of /spl sim/5…”
    Get full text
    Journal Article
  20. 20

    High Temperature Stable [Ir3Si-TaN]/HfLaON CMOS with Large Work-Function Difference by Wu, C.H., Hung, B.F., Chin, A., Wang, S.J., Chen, W.J., Wang, X.P., Li, M.-F., Zhu, C., Jin, Y., Tao, H.J., Chen, S.C., Liang, M.S.

    “…The authors report novel 1000degC-stable [Ir 3 Si-TaN]/HfLaON CMOS for the first time, where the self-aligned and gate-first process are full compatible to…”
    Get full text
    Conference Proceeding