Search Results - "Hovorka, Miloš"

Arctis WebUI redefines lamella preparation for cryo-electron tomography workflow by Vrbovská, Veronika, Spurný, Radovan, Kříž, Radim, Tichý, Radek, Tomášek, Pavel, Chvíla, Ladislav, Müllerová, Michaela, Kasáková, Anna, Mitchels, John, Hovorka, Miloš

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Advanced cryo‐tomography workflow developments – correlative microscopy, milling automation and cryo‐lift‐out by KUBA, JAKUB, MITCHELS, JOHN, HOVORKA, MILOŠ, ERDMANN, PHILIPP, BERKA, LUKÁŠ, KIRMSE, ROBERT, KÖNIG, JULIA, DE BOCK, JAN, GOETZE, BERNHARD, RIGORT, ALEXANDER

“…Summary Cryo‐electron tomography (cryo‐ET) is a groundbreaking technology for 3D visualisation and analysis of biomolecules in the context of cellular…”
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Risk element sorption/desorption characteristics of dry olive residue: a technique for the potential immobilization of risk elements in contaminated soils by Hovorka, Miloš, Száková, Jiřina, García-Sánchez, Mercedes, Acebal, Mercedes Blanc, García-Romera, Inmaculada, Tlustoš, Pavel

“…Olive oil production is one of the most relevant agroindustrial activities in the Mediterranean region and generates a huge amount of both solid and semi-solid…”
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Very low energy scanning electron microscopy by Frank, Luděk, Hovorka, Miloš, Konvalina, Ivo, Mikmeková, Šárka, Müllerová, Ilona

“…An overview of recent developments in very low energy scanning electron microscopy is presented. Electron optical aspects are briefly summarized including the…”
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A method of imaging ultrathin foils with very low energy electrons by Müllerová, Ilona, Hovorka, Miloš, Frank, Luděk

“…We demonstrate the possibility to examine the free-standing foils of thicknesses in units of nm in the scanning low energy electron microscope, using both…”
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Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films by Müllerová, Ilona, Hovorka, Miloš, Hanzlíková, Renáta, Frank, Lud\\v{e}k

“…Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions…”
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Scanning Electron Microscopy with Samples in an Electric Field by Frank, Ludĕk, Hovorka, Miloš, Mikmeková, Šárka, Mikmeková, Eliška, Müllerová, Ilona, Pokorná, Zuzana

“…The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” with a strong electric field just above the sample surface…”
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Grain Contrast Imaging in UHV SLEEM by Mikmeková, Šárka, Hovorka, Miloš, Müllerová, Ilona, Man, Ond\\v{r}ej, Pant\\v{e}lejev, Libor, Frank, Lud\\v{e}k

“…Study of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy…”
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Profiling N-Type Dopants in Silicon by Hovorka, Miloš, Mika, Filip, Mikulík, Petr, Frank, Lud\\v{e}k

“…Variously doped n-type structures (dopant concentration between 1.5*1016 cm−3 and 1.5*1019 cm−3) on a lightly doped p-type silicon substrate (doped to 1.9*1015…”
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Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons by Frank, Lud\\v{e}k, Mika, Filip, Hovorka, Miloš, Valdaitsev, Dimitrii, Schönhense, Gerd, Müllerová, Ilona

“…Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards…”
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