Search Results - "Houdy, Philippe"

Effects of residual stress on the mechanical and structural properties of TiC thin films grown by RF sputtering by Mani, Abderahim, Aubert, Pascal, Mercier, Florence, Khodja, Hicham, Berthier, Claire, Houdy, Philippe

“…Titanium carbide thin films show attractive mechanical properties for engineering applications. Thin films of TiC were deposited on a 〈100〉 silicon substrate…”
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Effects of residual stress on the mechanical and structural properties of TiC thin films grown by RF sputtering by Mani, Abderahim, Aubert, Pascal, Mercier, Florence, Khodja, Hicham, Berthier, Claire, Houdy, Philippe

“…Titanium carbide thin films show attractive mechanical properties for engineering applications. Thin films of TiC were deposited on a (100) silicon substrate…”
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Interface effect on tribological properties of titanium–titanium nitride nanolaminated structures by Sant, Catherine, Daia, Mouloud Ben, Aubert, Pascal, Labdi, Sid, Houdy, Philippe

“…Nanolaminated titanium–titanium nitride [Ti–TiN] n structures have been deposited on silicon 〈100〉 substrates by RF reactive sputtering in order to study their…”
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Electron Energy Loss Spectroscopy with Subnanometer Spatial Resolution on Compositionally Modulated TiN x Multilayers by Suenaga, Kazutomo, Colliex, Christian, Sant, Catherine, Labdi, Sid, Houdy, Philippe

“…Compositionally modulated TiNx multilayers (0.3 < x < 1, with a period of 8 nm) are investigatedby spatially resolved electron energy loss spectroscopy with a…”
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Ti/TiN multilayers for hard coatings applications: in-situ characterization by real time spectroscopic ellipsometry by Boher, Pierre, Stehle, Jean Louis, Labdi, Sid, Houdy, Philippe

“…Single Ti and TiN x thick films and Ti/TiN x multilayers have been deposited by reactive rf-sputtering with in-situ control by spectroscopic ellipsometry…”
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Electron energy loss spectroscopy with subnanometer spatial resolution on compositionally modulated TiNx multilayers by SUENAGA, K, COLLIEX, C, SANT, C, LABDI, S, HOUDY, P

“…Compositionally modulated TiNx multilayers (0.33 peak, so-called white line, broadens in accordance with the nitrogen concentration, due to a change in the d…”
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Manufacture and performances of rhodium/carbon multilayer x-ray mirrors by BOHER, P, HOUDY, P, KAIÊKATI, P, OUAHABI, M, BARCHEWITZ, R

“…A diode rf-sputtering technique was used to produce Rh/C multilayers for application in the soft-x-ray domain. In situ kinetic ellipsometry is used to…”
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Radio frequency sputtering of tungsten/tungsten nitride multilayers on GaAs by Boher, Pierre, Houdy, Philippe, Kaïkati, Pierre, Van Ijzendoorn, L. J.

“…Thick tungsten nitride films have been deposited on GaAs substrates using a reactive rf‐sputtering system. The optical indexes of the WN x films (determined by…”
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