Search Results - "Hooten, N."

Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect by Dodds, N. A., Hooten, N. C., Reed, R. A., Schrimpf, R. D., Warner, J. H., Roche, N. J., McMorrow, D., Wen, S., Wong, R., Salzman, J. F., Jordan, S., Pellish, J. A., Marshall, C. J., Gaspard, N. J., Bennett, W. G., Zhang, E. X., Bhuva, B. L.

“…Heavy ion, neutron, and laser experimental data are used to evaluate the effectiveness of various single event latchup (SEL) hardening strategies, including…”
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Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETs by El-Mamouni, F., Zhang, E. X., Pate, N. D., Hooten, N., Schrimpf, R. D., Reed, R. A., Galloway, K. F., McMorrow, D., Warner, J., Simoen, E., Claeys, C., Griffoni, A., Linten, D., Vizkelethy, G.

“…Through-wafer two-photon absorption laser experiments were performed on bulk FinFETs. Transients show distinct signatures for charge collection from drift and…”
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Differential Charge Cancellation (DCC) Layout as an RHBD Technique for Bulk CMOS Differential Circuit Design by Blaine, R. W., Atkinson, N. M., Kauppila, J. S., Armstrong, S. E., Hooten, N. C., Warner, J. H., Holman, W. T., Massengill, L. W.

“…A novel RHBD technique utilizing charge sharing to mitigate single-event voltage transients in differential circuits is demonstrated experimentally…”
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Efficient Method for Estimating the Characteristics of Radiation-Induced Current Transients by Bennett, W. G., Schrimpf, R. D., Hooten, N. C., Reed, R. A., Kauppila, J. S., Weller, R. A., Warren, K. M., Mendenhall, M. H.

“…An efficient method for estimating the characteristics of ion-induced current pulse transients is presented and related to the corresponding mechanisms of…”
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The Significance of High-Level Carrier Generation Conditions for Charge Collection in Irradiated Devices by Hooten, N. C., Edmonds, L. D., Bennett, W. G., Ahlbin, J. R., Dodds, N. A., Reed, R. A., Schrimpf, R. D., Weller, R. A.

“…Pulsed-laser induced charge-collection measurements in a bulk silicon diode are used to investigate charge collection mechanisms during high-level carrier…”
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Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization by Roche, N. J.-H, Buchner, S. P., Foster, C. C., King, M. P., Dodds, N. A., Warner, J. H., McMorrow, D., Decker, T., OaNeill, P. M., Reddell, B. D., Nguyen, K. V., Samsel, I. K., Hooten, N. C., Bennett, W. G., Reed, R. A.

“…The Variable Depth Bragg Peak method has been investigated for single event latchup testing by comparing latchup cross sections for heavy ions at low and high…”
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Single Particle Displacement Damage in Silicon by Auden, E. C., Weller, R. A., Mendenhall, M. H., Reed, R. A., Schrimpf, R. D., Hooten, N. C., King, M. P.

“…Single particle displacement damage events are reported in silicon diodes irradiated with 252 Cf and 241 Am. In situ measurements of reverse current show the…”
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High‐dose intravenous immunoglobulin as adjuvant treatment for grade IV acute cutaneous graft‐versus‐host disease by Blanchard, S.K., Sullivan, K.M., Hooten, J.N., Holcomb, Z. E., Rowe Nichols, K., Selim, M.A., Rao, C.L., Hall, R.P., Chao, N.J., Cardones, A.R.

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Opportunistic cutaneous fungal infections in the inpatient setting by Hooten, Joanna N., Cheng, Rui, Selim, M. Angelica, Hall III, Russell P., Cardones, Adela R.

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SEL-Sensitive Area Mapping and the Effects of Reflection and Diffraction From Metal Lines on Laser SEE Testing by Dodds, N. A., Hooten, N. C., Reed, R. A., Schrimpf, R. D., Warner, J. H., Roche, N. J.-H, McMorrow, D., Buchner, S., Jordan, S., Pellish, J. A., Bennett, W. G., Gaspard, N. J., King, M. P.

“…Laser and heavy-ion data reveal the areas and shapes of single-event latchup (SEL)-sensitive regions in CMOS test structures and their positions relative to…”
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Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction by Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., Baumann, R. C.

“…Variability in energy deposition from stopping ions and LET fluctuations is quantified for specific radiation environments. When compared to predictions using…”
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RHBD Technique for Single-Event Charge Cancellation in Folded-Cascode Amplifiers by Atkinson, N. M., Blaine, R. W., Kauppila, J. S., Armstrong, S. E., Loveless, T. Daniel, Hooten, N. C., Holman, W. T., Massengill, L. W., Warner, J. H.

“…A novel RHBD technique that exploits charge sharing is implemented in the single-ended gain stage of a folded-cascode operational amplifier to mitigate…”
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The Effect of High-Z Materials on Proton-Induced Charge Collection by Clemens, M A, Hooten, N C, Ramachandran, V, Dodds, N A, Weller, R A, Mendenhall, M H, Reed, R A, Dodd, P E, Shaneyfelt, M R, Schwank, J R, Blackmore, E W

“…Charge collection measurements reveal that the presence of high-Z materials increases proton-induced charge collection cross sections for high charge…”
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Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology by Gadlage, M J, Ahlbin, J R, Bhuva, B L, Hooten, N C, Dodds, N A, Reed, R A, Massengill, L W, Schrimpf, R D, Vizkelethy, G

“…Pulse widths of single-event transients produced by alpha particles in a 65-nm bulk CMOS technology are reported. The experimental setup and calibration of the…”
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Identification of pulse quenching enhanced layouts with subbandgap laser-induced single-event effects by Ahlbin, J. R., Hooten, N. C., Gadlage, M. J., Warner, J. H., Buchner, S. P., McMorrow, D., Massengill, L. W.

“…Pulsed-laser single-event effects experiments on a 65 nm bulk CMOS integrated circuit confirms the existence of single-event pulse quenching and supports…”
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Plasma neurofilament light and cognitive decline in a cohort study of urban adults by Beydoun, MA, Hooten, NN, Beydoun, HA, Maldonado, AI, Weiss, J, Michele, K Evans, Alan, B Zonderman

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Histotroph Composition and pH Changes Across the Estrous Cycle in Bovine by Hooten, Bailey N

“…Early pregnancy is the most susceptible to unstable conditions within the dam. Determining the correlation of uterine pH and protein changes through the…”
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Plasma gelsolin levels are associated with diabetes, sex, race, and poverty by Noren Hooten, Nicole, Mode, Nicolle A, Kowalik, Edward, Omoniyi, Victor, Zonderman, Alan B, Ezike, Ngozi, DiNubile, Mark J, Levinson, Susan L, Evans, Michele K

“…The growing epidemic of the inflammation-related metabolic disease, type 2 diabetes mellitus, presents a challenge to improve our understanding of potential…”
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Soft errors and NBTI in SiGe pMOS transistors by Fleetwood, D. M., Zhang, E. X., Duan, G. X., Zhang, C. X., Samsel, I. K., Hooten, N. C., Bennett, W. G., Schrimpf, R. D., Reed, R. A., Linten, D., Mitard, J.

“…We have investigated single event charge collection and negative-bias instabilities in SiGe pMOSFETs that are of interest for future commercial and space…”
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Updates on the management of autoimmune blistering diseases by Hooten, Joanna N, Hall, 3rd, Russell P, Cardones, Adela R

“…Autoimmune blistering diseases are rare, but potentially debilitating cutaneous disorders characterized by varying degrees of mucosal and cutaneous bullae…”
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