Search Results - "Honda, Koichiro"

Scanning nonlinear dielectric microscopy observation of accumulated charges in metal-SiO2-SiN-SiO2-Si flash memory by detecting higher-order nonlinear permittivity by Honda, Koichiro, Cho, Yasuo

“…Using scanning nonlinear dielectric microscopy with high-sensitivity capacitance variation detection capability, we succeeded in the high-resolution…”
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Fabrication and Characterization of Binary Piezoelectric (Bi1/2Na1/2)TiO3--Ba(Cu1/3Nb2/3)O3 Solid Solutions by Kobune, Masafumi, Teraoka, Kenji, Nishioka, Hiroshi, Yamaguchi, Hideshi, Honda, Koichiro

“…Perovskite-structured solid solutions with compositions of 0.9963{($1-x$)(Bi 1/2 Na 1/2 )TiO 3 --$x$Ba(Cu 1.1/3 Nb 2/3 )O 3 } + 0.0037MnO 2 , with $x =…”
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Nonlocality in spherical-aberration-corrected HAADF STEM images by Ohtsuka, Masahiro, Yamazaki, Takashi, Kotaka, Yasutoshi, Fujisawa, Hironori, Shimizu, Masaru, Honda, Koichiro, Hashimoto, Iwao, Watanabe, Kazuto

“…Nonlocality in spherical‐aberration‐corrected high‐angle annular dark‐field (HAADF) scanning transmission electron microscope (STEM) images is theoretically…”
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Visualization using scanning nonlinear dielectric microscopy of electrons and holes localized in the thin gate film of a metal–SiO2–Si3N4–SiO2–semiconductor flash memory by Honda, Koichiro, Cho, Yasuo

“…We have used scanning nonlinear dielectric microscopy to clarify the position of electrons and holes in the gate SiO2–Si3N4–SiO2 (ONO) film of a…”
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Structural control of self-assembled PbTiO3 nanoislands fabricated by metalorganic chemical vapor deposition by Nonomura, Hajime, Nagata, Masaki, Fujisawa, Hironori, Shimizu, Masaru, Niu, Hirohiko, Honda, Koichiro

“…Self-assembled PbTiO3 nanoislands of three different shapes with orderly in-plane directions were fabricated on Pt∕SrTiO3 substrates by metalorganic chemical…”
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Ferroelectricity and local currents in epitaxial 5- and 9-nm-thick Pb(Zr,Ti)O3 ultrathin films by scanning probe microscopy by Fujisawa, Hironori, Shimizu, Masaru, Niu, Hirohiko, Nonomura, Hajime, Honda, Koichiro

“…Ferroelectricity and local currents in 5- and 9-nm-thick Pb(Zr,Ti)O3 ultrathin films epitaxially grown on SrRuO3∕SrTiO3(100) are investigated by…”
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Visualization of electrons and holes localized in gate thin film of metal SiO2–Si3N4–SiO2 semiconductor-type flash memory using scanning nonlinear dielectric microscopy after writing-erasing cycling by Honda, Koichiro, Hashimoto, Sunao, Cho, Yasuo

“…We applied scanning nonlinear dielectric microscopy and succeeded in clarifying the position of the electrons/holes in the gate SiO2–Si3N4–SiO2 (ONO) film of…”
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High Speed Pulse Measurement of Micro Ferroelectric Capacitors Using a Multi-Probe Atomic Force Microscope by Kin, Nobuhiro, Takai, Kazuaki, Honda, Koichiro

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Analysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope by Kin, Nobuhiro, Honda, Koichiro

“…It is widely recognized that, in ferroelectric bulk or thin films, the coercive voltage ( V c ) increases at low temperatures and the remnant polarization ( P…”
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Ferro- and piezoelectric properties of (Bi3.25Nd0.75)Ti3O12 nanoplates epitaxially grown on Nb:TiO2(101) substrates by sputtering by Kobune, M., Tamura, A., Imagawa, K., Kishimoto, R., Nishioka, H., Nakashima, S., Fujisawa, H., Shimizu, M., Yamaguchi, H., Honda, K.

“…Epitaxially a- and b-axis-oriented (Bi 3.25 Nd 0.75 )Ti 3 O 12 (BNT-0.75) films and nanoplates have been fabricated on four Nb:TiO 2 (101) substrates with…”
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SELF-ASSEMBLED PbTiO3 NANO-ISLANDS PREPARED ON SrTiO3 BY METALORGANIC CHEMICAL VAPOR DEPOSITION by Nonomura, H, Fujisawa, H, Shimizu, M, Niu, H, Honda, K

“…PbTiO3 nano-islands were prepared on Pt(111)/SiO2/Si(100), Pt(111) /SrTiO3(111) and Pt(110)/SrTiO3(110) substrates by MOCVD. When PbTiO3 was deposited on…”
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Growth of ferroelectric PbZr Ti1−O3 thin films by metalorganic chemical vapor deposition (MOCVD) by Shimizu, Masaru, Fujisawa, Hironori, Niu, Hirohiko, Honda, Koichiro

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MICROSTRUCTURE AND ELECTRICAL PROPERTIES OF (Pb, La)(Zr, Ti)O3 FILMS CRYSTALLIZED FROM AMORPHOUS STATE BY TWO-STEP POSTDEPOSITION ANNEALING by Kobune, M, Matsuura, O, Matsuzaki, T, Sawada, T, Fujisawa, H, Shimizu, M

“…Dense amorphous PLZT films with composition (Pb0.925La0.075)(Zr0.4Ti0.6)0.981O3 were deposited on Pt/MgO(100) substrates by rf-magnetron sputtering without…”
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Visualization using scanning nonlinear dielectric microscopyof electrons and holes localized in the thin gate filmof a metal- SiO 2 - Si 3 N 4 - SiO 2 -semiconductor flash memory by Honda, Koichiro, Cho, Yasuo

“…We have used scanning nonlinear dielectric microscopy to clarify the position of electrons and holes in the gate SiO 2 - Si 3 N 4 - SiO 2 (ONO) film of a…”
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Fabrication and Characterization of Binary Piezoelectric (Bi 1/2 Na 1/2 )TiO 3 –Ba(Cu 1/3 Nb 2/3 )O 3 Solid Solutions by Kobune, Masafumi, Teraoka, Kenji, Nishioka, Hiroshi, Yamaguchi, Hideshi, Honda, Koichiro

“…Perovskite-structured solid solutions with compositions of 0.9963(1- x )(Bi 1/2 Na 1/2 )TiO 3 – x Ba(Cu 1.1/3 Nb 2/3 )O 3 + 0.0037MnO 2 , with x = 0–0.06…”
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Fabrication and Characterization of Binary Piezoelectric (Bi 1/2 Na 1/2 )TiO 3 –Ba(Cu 1/3 Nb 2/3 )O 3 Solid Solutions by Kobune, Masafumi, Teraoka, Kenji, Nishioka, Hiroshi, Yamaguchi, Hideshi, Honda, Koichiro

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Visualization of electrons and holes localized in gate thin film of metal Si O 2 - Si 3 N 4 - Si O 2 semiconductor-type flash memory using scanning nonlinear dielectric microscopy after writing-erasing cycling by Honda, Koichiro, Hashimoto, Sunao, Cho, Yasuo

“…We applied scanning nonlinear dielectric microscopy and succeeded in clarifying the position of the electrons/holes in the gate Si O 2 - Si 3 N 4 - Si O 2…”
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Characterization of (Bi3.25Nd0.75)Ti3O12 Thin Films with $a$- and $b$-Axis Orientations Deposited on Nb:TiO2 Substrates by High-Temperature Sputtering by Kobune, Masafumi, Tamura, Akihiro, Oshima, Hisashi, Imagawa, Kazuki, Daiko, Yusuke, Mineshige, Atsushi, Yazawa, Tetsuo, Fujisawa, Hironori, Shimizu, Masaru, Yamaguchi, Hideshi, Honda, Koichiro

“…$a$- and $b$-axis-oriented (Bi 3.25 Nd 0.75 )Ti 3 O 12 (BNT-0.75) films, 3.0 \mbox{$\mu$m} thick, were fabricated on conductive Nb:TiO 2 (101) substrates with…”
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Effects of Hot Isostatic-Pressing Treatment on Properties of PbMg^sub 0.047^Nb^sub 0.095^Zr^sub 0.416^Ti^sub 0.442^O^sub 3^ Thin Films by Kobune, Masafumi, Hasegawa, Yuki, Daiko, Yusuke, Mineshige, Atsushi, Yazawa, Tetsuo, Yamaguchi, Hideshi, Honda, Koichiro

“…c-axis-oriented epitaxial 1.2-...m PbMg...Nb...Zr...Ti...O... (PMNZT) films with a comparatively large piezoelectric coefficient d... (=90 pC/N) fabricated on…”
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Effects of Hot Isostatic-Pressing Treatment on Properties of PbMg 0.047 Nb 0.095 Zr 0.416 Ti 0.442 O 3 Thin Films by Kobune, Masafumi, Hasegawa, Yuki, Daiko, Yusuke, Mineshige, Atsushi, Yazawa, Tetsuo, Yamaguchi, Hideshi, Honda, Koichiro

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