Search Results - "Holtkamp, DB"

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    Investigation of shock-induced light from sapphire for use in pyrometry studies by Partouche-Sebban, D., Pélissier, J.L., Anderson, W.W., Hixson, R.S., Holtkamp, D.B.

    Published in Physica. B, Condensed matter (15-07-2005)
    “…Pyrometry measurements on shock-heated metals are often performed through a transparent window acting as a shock anvil. Sapphire is an interesting anvil…”
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    Journal Article
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    An Emittance Scanner for Intense Low-Energy Ion Beams by Allison, Paul W., Sherman, Joseph D., Holtkamp, David B.

    Published in IEEE transactions on nuclear science (01-01-1983)
    “…An emittance scanner has been developed for use with low-energy H- ion beams to satisfy the following requirements: (1) angular resolution of ± 1/2 mrad, (2)…”
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    Journal Article Conference Proceeding
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    Spatial variability of water vapor turbulent transfer within the boundary layer by COOPER, D. I, EICHINGER, W. E, HOLTKAMP, D. B, KARL, R. R, QUICK, C. R, DUGAS, W, HIPPS, L

    Published in Boundary-layer meteorology (01-12-1992)
    “…Although the physics of evaporation within the inner region of the boundary layer is believed to be well understood, observations of mass-energy exchange…”
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    Journal Article
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    Derivation of water vapor fluxes from lidar measurements by EICHINGER, W. E, COOPER, D. I, HOLTKAMP, D. B, KARL, R. R, QUICK, C. R, TIEE, J. J

    Published in Boundary-layer meteorology (01-02-1993)
    “…Two techniques are described by which the flux of water vapor can be derived from concentration measurements made by a Raman-Lidar. Monin-Obukhov similarity…”
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    Journal Article
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    Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation by Browning, J.S., Holtkamp, D.B.

    Published in IEEE transactions on nuclear science (01-12-1988)
    “…Cumulative fractions for linear energy transfer spectra were measured for particles ejected from microelectronics packaging materials subjected to neutron and…”
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    Journal Article
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    High energy proton SEU test results for the commercially available MIPS R3000 microprocessor and R3010 floating point unit by Shaeffer, D.L., Kimbrough, J.R., Denton, S.M., Kaschmitter, J.L., Wilburn, J.W., Davis, R.W., Colella, N.J., Holtkamp, D.B.

    “…Proton single event upset (SEU) cross sections and proton total dose hardness of commercially available MIPS R3000 microprocessors (CPU) and R3010 floating…”
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    Journal Article Conference Proceeding
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