Search Results - "Hole, D.E"

The problem of dating quartz 1: Spectroscopic ionoluminescence of dose dependence by King, G.E., Finch, A.A., Robinson, R.A.J., Hole, D.E.

“…A suite of quartz samples of different provenances, irradiation, thermal and depositional histories were analysed using spectroscopic ionoluminescence (IL) to…”
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Influence of UV irradiation and RTA process on optical properties of Si implanted SiO2 by Iwayama, T.S., Hama, T., Hole, D.E.

“…Si ion implantation was widely used to synthesize specimens of SiO2 containing supersaturated Si and subsequent high temperature annealing induces the…”
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Lamp annealing effects on the formation process of implanted silicon nanocrystals in SiO2 by Iwayama, T.S., Hama, T., Hole, D.E.

“…Si ion implantation into SiO2 and subsequent high temperature anneals induce the formation of embedded luminescent Si nanocrystals. The potentialities of rapid…”
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Low temperature formation of luminescent Si nanocrystals with combined process of excimer UV-light irradiation and RTA by Iwayama, T.S., Fukaya, S., Watanabe, H., Hama, T., Hole, D.E.

“…Si ion implantation was widely used to synthesize specimens of SiO2 containing supersaturated Si and subsequent high temperature annealing induces the…”
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Reduction of the size of the implanted silver nanoparticles in float glass during excimer laser annealing by Stepanov, A.L, Hole, D.E, Bukharaev, A.A, Townsend, P.D, Nurgazizov, N.I

“…Silver nanoparticles have been synthesised by ion implantation in float glass at 60 keV to a dose of 7.0×10 16 ion/cm 2 and a current density of 10 μA/cm 2 at…”
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Modification of size distribution of ion implanted silver nanoparticles in sodium silicate glass using laser and thermal annealing by Stepanov, A.L., Hole, D.E., Townsend, P.D.

“…Silver nanoparticles have been synthesised by ion implantation in soda–lime silicate glass at 60 keV to a dose of 7.0×1016 ion/cm2 and a current density of 10…”
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Ion beam analysis of float glass surface composition by Lamouroux, F., Can, N., Townsend, P.D., Farmery, B.W., Hole, D.E.

“…Data are reported on ion beam surface analysis methods of proton-induced X-ray emission (PIXE), and helium-induced X-ray emission (HIXE), made simultaneously…”
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Gallium colloid formation during ion implantation of glass by Hole, D.E., Townsend, P.D., Barton, J.D., Nistor, L.C., Van Landuyt, J.

“…Data are reported on the size and depth distribution of gallium colloids formed by gallium ion implantation at energies of 50 and 60 keV, and nominal doses up…”
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Influence of UV irradiation and RTA process on optical properties of Si implanted SiO 2 by Iwayama, T.S., Hama, T., Hole, D.E.

“…Si ion implantation was widely used to synthesize specimens of SiO 2 containing supersaturated Si and subsequent high temperature annealing induces the…”
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Post-mortem measurements of fuel retention at JET in 2007–2009 experimental campaign by Koivuranta, S., Likonen, J., Hakola, A., Coad, J.P., Widdowson, A., Hole, D.E., Rubel, M.

“…The deuterium inventory at Joint European Torus (JET) after the 2007–2009 experimental campaign has been evaluated using Nuclear Reaction Analysis (NRA) and…”
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Information obtainable from ion beam luminescence by Townsend, P.D., Khanlary, M., Hole, D.E.

“…During ion beam implantation there is associated luminescence from insulators which contains information on the crystallinity of the host lattice, the…”
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On the luminescence emission band at 340 nm of stressed tectosilicate lattices by Garcia-Guinea, J., Correcher, V., Sanchez-Muñoz, L., Finch, A.A., Hole, D.E., Townsend, P.D.

“…A 340 nm emission peak in the luminescence spectra of tectosilicate minerals, e.g., groups of silica, feldspars, feldspathoids, could be observed when the…”
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Erosion/deposition issues at JET by Coad, J.P., Bekris, N., Elder, J.D., Erents, S.K., Hole, D.E., Lawson, K.D., Matthews, G.F., Penzhorn, R.-D., Stangeby, P.C.

“…Deposition and H-isotope retention in JET is highly asymmetric, with deposition predominantly in the inner divertor, where flaking deposits form on…”
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Structural studies of deposited layers on JET MkII-SRP inner divertor tiles by Likonen, J., Coad, J.P., Vainonen-Ahlgren, E., Renvall, T., Hole, D.E., Rubel, M., Widdowson, A.

“…Deposited layers formed on JET inner divertor tiles during 1998–2004 and 2001–2004 campaigns have been investigated using secondary ion mass spectrometry…”
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RTA effects on the formation process of embedded luminescent Si nanocrystals in SiO 2 by Iwayama, T.S., Hama, T., Hole, D.E.

“…It is well known that Si ion implantation into SiO 2 and subsequent high temperature anneals induce the formation of embedded luminescent Si nanocrystals. In…”
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Control of embedded Si nanocrystals in SiO 2 by rapid thermal annealing and enhanced photoluminescence characterization by Iwayama, T.S., Hama, T., Hole, D.E., Boyd, I.W.

“…It is well known that Si implantation into SiO 2 and subsequent high temperature annealing induce the formation of embedded luminescent Si nanocrystals. In…”
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Post-mortem measurements of fuel retention at JET with MKII-SRP divertor by Likonen, J., Coad, J.P., Hole, D.E., Koivuranta, S., Renvall, T., Rubel, M., Vainonen-Ahlgren, E., Widdowson, A.

“…The deuterium inventory at JET after 2001–2004 operational campaign has been determined using nuclear reaction analysis (NRA) and secondary ion mass…”
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Formation of silver nanoparticles in soda–lime silicate glass by ion implantation near room temperature by Stepanov, A.L., Hole, D.E., Townsend, P.D.

“…The synthesis of silver nanoparticles in soda–lime silicate glass near room temperature is reported. Nanoparticles were prepared during 60 keV Ag-implantation…”
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Erosion and deposition in the JET MkII-SRP divertor by Coad, J.P., Andrew, P., Erents, S.K., Hole, D.E., Likonen, J., Mayer, M., Pitts, R., Rubel, M., Strachan, J.D., Vainonen-Ahlgren, E., Widdowson, A.

“…Carbon-13 labelled methane was injected into the outer divertor during a series of H-mode discharges on the last day of operations with the JET MkII-SRP…”
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Erosion/deposition in JET during the period 1999–2001 by Coad, J.P., Andrew, P., Hole, D.E., Lehto, S., Likonen, J., Matthews, G.F., Rubel, M.

“…Coated divertor and wall tiles exposed in JET for the 1999–2001 operations have been used to assess erosion/deposition. Deposited films of up to 90 μm…”
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