Search Results - "Hoguet, D."
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14nm FDSOI technology for high speed and energy efficient applications
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01-06-2014)“…This paper presents a 14nm technology designed for high speed and energy efficient applications using strain-engineered FDSOI transistors. Compared to the 28nm…”
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Conference Proceeding -
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Patients (pts) accessible to interview in palliative care unit: Analysis of inherent biases
Published in Journal of clinical oncology (20-05-2011)“…Abstract only…”
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Journal Article -
3
Test structures for interdie variations monitoring in presence of statistical random variability
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01-03-2012)“…We study the limitations of single transistor test structures for Process Variations monitoring in presence of statistical random variability, and compare them…”
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Conference Proceeding -
4
Serious ocular complications of cosmetic iris implants in 14 eyes
Published in Journal of cataract and refractive surgery (01-03-2012)“…Purpose To report the presentation and subsequent management of a series of patients presenting with cosmetic iris implants. Setting New York Eye and Ear…”
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Journal Article -
5
Reply: Complications related to the explantation of cosmetic iris implants
Published in Journal of cataract and refractive surgery (01-10-2012)Get full text
Journal Article