Search Results - "Hofker, W. K."

Boron implantations in silicon: A comparison of charge carrier and boron concentration profiles by Hofker, W. K., Werner, H. W., Oosthoek, D. P., Koeman, N. J.

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Laser irradiation of silicon containing misfit dislocations by Hofker, W K, Oosthoek, D P, Eggermont, G E J, Tamminga, Y, Stacy, W T

“…Silicon containing misfit dislocations caused by ion implantation and thermal annealing were irradiated with a scanning Q-switched Nd-YAG laser. It was found…”
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Erratum: Laser irradiation of silicon containing misfit dislocations by Hofker, W. K., Oosthoek, D. P., Eggermont, G. E. J., Tamminga, Y., Stacy, W. T.

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Influence of annealing on the concentration profiles of boron implantations in silicon by Hofker, W. K., Werner, H. W., Oosthoek, D. P., de Grefte, H. A. M.

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The Checker Board Counter: A Semiconductor dE/dx Detector with Position Indication by Hofker, W. K., Oosthoek, D. P., Hoeberechts, A. M. E., van Dantzig, R., Mulder, K., Oberski, J. E. J., Koerts, L. A. Ch, Dieperink, J. H., Kok, E., Rumphorst, R. F.

“…As part of an extensive design study for a cyclotron project containing a few hundred semiconductor detectors of different types, we have developed a new…”
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