High resolution X-ray Laue topography of thick quartz crystals at SPring-8

High resolution X-ray Laue topography of thick quartz crystals at SPring-8

High resolution X-ray Laue topography was conducted on the SPring-8 BL-28B2 beamline, operating at a 5–100 keV energy range. The use of this beamline was particularly suitable for characterization of thick samples of giant blocks of natural quartz used as seeds for growing synthetic quartz; and also...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 199; pp. 85 - 89
Main Authors: Suzuki, Carlos K., Shinohara, Armando H., Hiramatsu, Carlos Q., Yoshimura, Jun-ichi, Reid, James B., Kajiwara, Kentaro, Chikaura, Yoshinori
Format: Journal Article
Language:English
Published: Elsevier B.V 2003
Subjects:
Dislocation lines
High energy X-ray Laue topography
Thick quartz crystals
Dislocation lines
Thick quartz crystals
High energy X-ray Laue topography
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Summary:High resolution X-ray Laue topography was conducted on the SPring-8 BL-28B2 beamline, operating at a 5–100 keV energy range. The use of this beamline was particularly suitable for characterization of thick samples of giant blocks of natural quartz used as seeds for growing synthetic quartz; and also to understand the propagation mechanism of dislocation lines in synthetic quartz. Area enlargement of Laue topographs by scanning the sample-film stage in the vertical direction was particularly useful for high energy diffraction images, due to their relatively small vertical dimensions. The methodology applied to characterize thick crystals used in the present research, is an effective contribution to develop nearly perfect large dimension seeds and synthetic quartz bars for the next generation of “surface acoustic waves” device substrates.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(02)01409-X