Search Results - "Hideto Yanagisawa, Hideto Yanagisawa"
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Preparation of Oxygen-Containing Pt and Pt Oxide Thin Films by Reactive Sputtering and Their Characterization
Published in Japanese Journal of Applied Physics (01-08-1998)“…Oxygen-containing Pt and Pt oxide thin films were prepared by reactive sputtering in Ar and O 2 gas atmosphere and effects of oxygen flow ratio on…”
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Single-Oriented Growth of (111) Cu Film on Thin ZrN/Zr Bilayered Film for ULSI Metallization
Published in Japanese Journal of Applied Physics (01-10-2000)“…We investigated the influence of ZrN/Zr bilayered film thickness on the (111) Cu orientation and the thermal stability of the Cu/ZrN/Zr/Si contact system by…”
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Dielectric Properties of Zr--Al Anodized Thin Film Capacitors Prepared Using Al-Doped Zr Alloy Films
Published in Japanese Journal of Applied Physics (01-10-2010)“…We have examined the dielectric properties of Zr--Al anodized thin film capacitors prepared using Al-doped Zr alloy films to improve the thermal stability and…”
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Crystal Orientation of Epitaxial α-Ta(110) Thin Films Grown on Si(100) and Si(111) Substrates by Sputtering
Published in Japanese Journal of Applied Physics (01-07-2008)Get full text
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Epitaxial Growth of (0001)Ru Thin Films on (111)ZrN/(111)Si by Low-Temperature Process and Their Surface Morphologies
Published in Japanese Journal of Applied Physics (01-03-2008)Get full text
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Study on Preparation Conditions of High-Quality ZrN Thin Films Using a Low-Temperature Process
Published in Japanese Journal of Applied Physics (01-10-1998)“…We have investigated the preparation conditions of stoichiometric ZrN films with low resistivity and high crystallinity at relatively low temperatures using an…”
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Study on Preparation Conditions of Single-Oriented (002) Zr Thin Films on n-(001) Si
Published in Japanese Journal of Applied Physics (01-07-2000)“…We have investigated the preparation conditions of single-oriented (002) Zr film on n-(001) Si by varying the sputtering parameters during deposition using an…”
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Epitaxial Growth of (001)ZrN Thin Films on (001)Si by Low Temperature Process
Published in Japanese Journal of Applied Physics (01-01-2005)“…We have prepared (001)ZrN films epitaxially grown on (001)Si substrates by a low temperature process using an ultrahigh vacuum magnetron sputtering system, and…”
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Realization of Cu(111) Single-Oriented State on SiO 2 by Annealing Cu–Zr Film and the Thermal Stability of Cu–Zr/ZrN/Zr/Si Contact System
Published in Japanese Journal of Applied Physics (01-07-2001)“…We investigated whether the Cu(111) single-oriented state having excellent electromigration resistance could be realized on SiO 2 /Si and Si wafers by…”
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A Study on the Preparation Conditions of Single Oriented (002) Hf Film on n-(001) Si
Published in Japanese Journal of Applied Physics (01-02-1998)“…We have investigated the preparation conditions of a single oriented (002) Hf film on n-(001) Si, by varying the sputtering parameters during deposition. The…”
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Preparation of a Contact System with a Single-Oriented (111)Al Overlayer by Interposing a Thin ZrN/Zr Bilayered Barrier Applicable to Sub-0.25-µm Design Rule
Published in Japanese Journal of Applied Physics (01-06-2001)“…Sequential single-oriented growth of a (111)Al/(111)ZrN/(002)Zr trilayered film could be realized on (001)Si, when a ZrN(200 Å)/Zr(200 Å) bilayered film was…”
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Formation Process and Electrical Property of RuO 2 Thin Films Prepared by Reactive Sputtering
Published in Japanese Journal of Applied Physics (01-06-1998)Get full text
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Preparation of Cu 10 Zr 7 Intermetallic Compound Film and Its Application as a Diffusion Barrier in Cu/Cu 10 Zr 7 /ZrN/Si Contact System
Published in Japanese Journal of Applied Physics (01-12-1997)“…We investigated the diffusion barrier properties of Cu 10 Zr 7 intermetallic compound film for possible application to Cu metallization technology. First, a…”
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ELECTRICAL PROPERTIES OF HfO2 THIN INSULATING FILM PREPARED BY ANODIC OXIDATION
Published in Jpn.J.Appl.Phys ,Part 1. Vol. 41, no. 8, pp. 5284-5287. 2002 (2002)“…Polycrystalline HfO2 thin film capacitors were prepared by anodizing sputter-deposited Hf films, and their capacitor and leakage current properties were…”
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Initial Silicide Formation Process of Single Oriented (002) Hf Film on Si and Its Diffusion Barrier Property
Published in Japanese Journal of Applied Physics (01-04-1998)“…We have investigated the initial silicide formation process of the single oriented (002) Hf film on (001) Si and compared it with that of the polycrystalline…”
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Effects of Sputtering Parameters on the Formation of Single-Oriented (002) Ti Film on Si
Published in Japanese Journal of Applied Physics (01-01-2005)“…We investigated the preparation conditions of a single-oriented (002) Ti film on a Si substrate, as functions of sputtering parameters, using an…”
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Realization of Sequential Epitaxial Growth of Cu/HfN Bilayered Films on (111) and (001) Si
Published in Japanese Journal of Applied Physics (2003)“…Cu films were deposited on epitaxial HfN/Si systems using a dc magnetron sputtering system without breaking the vacuum. Crystal orientation of Cu films was…”
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Preparation of Low-Resistivity α -Ta Thin Films on (001) Si by Conventional DC Magnetron Sputtering
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PREPARATION OF A CONTACT SYSTEM WITH A SINGLE-ORIENTED (111)Al OVERLAYER BY INTERPOSING A THIN ZrN/Zr BILAYERED BARRIER APPLICABLE TO SUB-0.25-mu m DESIGN RULE
Published in Jpn.J.Appl.Phys ,Part 1. Vol. 40, no. 6A, pp. 4193-4194. 2001 (01-06-2001)“…Sequential single-oriented growth of a (111)Al/(111)ZrN/(002)Zr trilayered film could be realized on (001)Si, when a ZrN(200 angstroms)/Zr(200 angstroms)…”
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