Search Results - "Hetherington, C.J.D."

Materials Advances through Aberration-Corrected Electron Microscopy by Pennycook, Stephen J, Varela del Arco, Maria, Hetherington, Crispin J. D., Kirkland, Angus I.

“…Over the last few years, the performance of electron microscopes has undergone a dramatic improvement, with achievable resolution having more than doubled. It…”
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The mechanical properties of tungsten grown by chemical vapour deposition by Murphy, J.D., Giannattasio, A., Yao, Z., Hetherington, C.J.D., Nellist, P.D., Roberts, S.G.

“…The mechanical properties of polycrystalline tungsten grown by chemical vapour deposition (CVD) have been investigated. Fracture tests were performed on the…”
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Sub-Ångstrom high-resolution transmission electron microscopy at 300keV by O’Keefe, M.A., Hetherington, C.J.D., Wang, Y.C., Nelson, E.C., Turner, J.H., Kisielowski, C., Malm, J.-O., Mueller, R., Ringnalda, J., Pan, M., Thust, A.

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Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution by Kisielowski, C., Hetherington, C.J.D., Wang, Y.C., Kilaas, R., O’Keefe, M.A., Thust, A.

“…It is reported that lattice imaging with a 300 kV field emission microscope in combination with numerical reconstruction procedures can be used to reach an…”
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Microscopy of Semiconducting Materials 1997: Edited by A. G. C ULLIS and J. L. H UTCHISON . Proceedings of the RMS Conference, Oxford University, 7–10 April 1997. Institute of Physics Conference Series 157. Hardback, 709 pages. ISBN 0‐7503‐0464‐2. £200, $400 by Hetherington, C.J.D.

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Sub-Ångstrom high-resolution transmission electron microscopy at 300 keV by O’Keefe, M.A., Hetherington, C.J.D., Wang, Y.C., Nelson, E.C., Turner, J.H., Kisielowski, C., Malm, J.-O., Mueller, R., Ringnalda, J., Pan, M., Thust, A.

“…Sub-Ångstrom transmission electron microscopy has been achieved at the National Center for Electron Microscopy (NCEM) by a one-Ångstrom microscope (OÅM)…”
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Carbon micro- and nanotubes synthesized by PE-CVD technique: Tube structure and catalytic particles crystallography by Kiselev, N.A, Hutchison, J.L, Moravsky, A.P, Rakova, E.V, Dreval, E.V, Hetherington, C.J.D, Zakharov, D.N, Sloan, J, Loutfy, R.O

“…The structure of carbon micro- and nanotubes synthesized by the plasma-enhanced (PE) PE-CVD technique has been investigated by SEM, TEM, SAED and HRTEM. It is…”
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Aluminium precipitates in the primary silicon of as-sprayformed hypereutectic aluminium-silicon alloys by Hogg, S.C., Hetherington, C.J.D., Atkinson, H.V.

“…Precipitates have been observed in the primary silicon of as-spray-formed hypereutectic aluminium-silicon alloys with and without various alloy additions. The…”
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Alignment mechanisms between particles in crystalline aggregates by Collier, A.P, Hetherington, C.J.D, Hounslow, M.J

“…This paper examines the effect of mechanisms leading to alignment between the individual particles which make up aggregated crystal systems. It is postulated…”
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Electron microscopy observations on the role of twinning in the evolution of microstructures by Dahmen, U, Hetherington, C J D, Radmilovic, V, Johnson, E, Xiao, S Q, Luo, C P

“…Twinning plays an important role in phase transformations and can have significant effects on microstructural evolution. Different roles of twinning in the…”
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Imaging columns of the light elements carbon, nitrogen and oxygen with sub angstrom resolution by Kisielowski, C., Hetherington, C.J.D., Wang, Y.C., Kilaas, R., O'Keefe, M.A., Thust, A.

“…It is reported that lattice imaging with a 300 kV field emission microscope in combination with numerical reconstruction procedures can be used to reach an…”
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Microscopy of Semiconducting Materials 1997 by Hetherington, C.J.D.

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