Search Results - "Henderson, T.S."

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  1. 1

    Observation of resonant tunneling at room temperature in GaInP/GaAs/GaInP double-heterojunction bipolar transistor by Liu, W., Seabaugh, A.C., Henderson, T.S., Yuksel, A., Beam, E.A., Fan, S.

    Published in IEEE transactions on electron devices (01-08-1993)
    “…Negative differential resistance (NDR) has been observed at room temperature in GaInP/GaAs double-heterojunction bipolar transistors (DHBTs). Both the…”
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    Journal Article
  2. 2

    On the collapse of drain I-V characteristics in modulation-doped FET's at cryogenic temperatures by Fischer, R., Drummond, T.J., Klem, J., Kopp, W., Henderson, T.S., Perrachione, D., Morkoc, H.

    Published in IEEE transactions on electron devices (01-08-1984)
    “…The collapse of the drain current-voltage characteristics of modulation-doped field-effect transistors (MODFET's) at cryogenic temperatures, previously thought…”
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    Journal Article
  3. 3

    Determination of carrier saturation velocity in high-performance InyGa1-yAs/AlxGa1-xAs modulation-doped field-effect transistors (0 ≤ y ≤ 0.2) by Henderson, T.S., Masselink, W.T., Kopp, W., Morkoc, H.

    Published in IEEE electron device letters (01-05-1986)
    “…We describe a new method for determining the carrier saturation velocity υ sat in modulation-doped field-effect transistors (MODFET's). High-performance…”
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    Journal Article
  4. 4

    Low-noise behavior of InGaAs quantum-well-structured modulation-doped FET's from 10-2to 108Hz by Liu, S.-M.J., Das, M.B., Chin-Kun Peng, Klem, J., Henderson, T.S., Kopp, W.F., Morkoc, H.

    Published in IEEE transactions on electron devices (01-05-1986)
    “…Equivalent gate noise voltage spectra of 1-µm gate-length modulation-doped FET's with pseudomorphic InGaAs quantum-well structure have been measured for the…”
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    Journal Article
  5. 5

    The GaAs heterojunction bipolar transistor: an electron device with optical device reliability by Henderson, T.S.

    Published in Microelectronics and reliability (01-11-1996)
    “…GaAs-based heterojunction bipolar transistors (HBTs) are of interest for a wide variety of applications. However, concerns about the long-term stability of the…”
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    Journal Article Conference Proceeding
  6. 6

    The GaAs heterojunction bipolar transistor: an electron device with optical device reliability by Henderson, T.S.

    “…GaAs-based heterojunction bipolar transistors (HBTs) are of interest for a wide variety of applications. However, concerns about the long-term stability of the…”
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    Conference Proceeding
  7. 7
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  9. 9

    The dependence of 77 K electron velocity-field characteristics on low-field mobility in AlGaAs-GaAs modulation-doped structures by Masselink, W.T., Henderson, T.S., Klem, J., Kopp, W.F., Morkoc, H.

    Published in IEEE transactions on electron devices (01-05-1986)
    “…We have used the geometrical magnetoresistance method to measure the electron velocities and mobilities as functions of electric field in AlGaAs-GaAs…”
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    Journal Article
  10. 10

    An InAlAs/InGaAs heterojunction bipolar transistor clocked latch on InP by Henderson, T.S., Taddiken, A.H., Kao, Y.C.

    Published in IEEE transactions on electron devices (01-06-1990)
    “…A clocked latch functioning as a simple comparator with InAlAs/InGaAs heterojunction bipolar transistors (HBTs) on an InP substrate is discussed. Typical…”
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    Journal Article
  11. 11

    Design of enhanced Schottky-barrier AlGaAs/GaAs MODFET's using highly doped p+surface layers by Priddy, K.L., Kitchen, D.R., Grzyb, J.A., Litton, C.W., Henderson, T.S., Chin-Kun Peng, Kopp, W.F., Morkoc, H.

    Published in IEEE transactions on electron devices (01-02-1987)
    “…The design and performance of enhanced Schottky-barrier height modulation-doped AlGaAs/GaAs field-effect transistors (ESMODFET's) is discussed. Results are…”
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    Journal Article
  12. 12

    Microwave characterization of (Al,Ga)As/GaAs modulation-doped FET's: Bias dependence of small-signal parameters by Arnold, D.J., Fischer, R., Kopp, W.F., Henderson, T.S., Morkoc, H.

    Published in IEEE transactions on electron devices (01-10-1984)
    “…Microwave characterization on 1-µm gate (Al, Ga)As/GaAs modulation-doped field-effect transistors (MODFET's) was done using a network analyzer. Equivalent…”
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    Journal Article
  13. 13

    Improved reliability self-aligned C/X-band monolithic power HBT amplifiers fabricated with a low-stress process by Henderson, T.S., Kim, T.S.

    “…We report extensive reliability testing and analysis on GaAs single-finger C/X-band HBTs fabricated for monolithic amplifiers with a low-stress process, The…”
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    Conference Proceeding
  14. 14

    Reliability of self-aligned, ledge passivated 7.5 GHz GaAs/AlGaAs HBT power amplifiers under RF bias stress at elevated temperatures by Henderson, T.S., Ikalainen, P.K.

    “…We report a two-temperature RF bias stress test on nominal 1.2 W 2.5 GHz GaAs/AlGaAs HBT unit cell amplifiers. MTTFs of 2020 and 1340 hours were obtained at…”
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    Conference Proceeding
  15. 15

    Determination of band offsets in AlGaAs/GaAs and InGaAs/GaAs multiple quantum wells by Ji, G., Huang, D., Reddy, U. K., Unlu, H., Henderson, T. S., Morkoç, H.

    “…The determination of valence band offsets Q v by fitting the optical transmission spectra for Al x Ga1−x As/GaAs and In y Ga1−y As/GaAs multiple quantum wells…”
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    Journal Article
  16. 16

    The Employment Medical Advisory Service by Henderson, R. T., Carter, J. T.

    Published in Postgraduate medical journal (01-06-1990)
    “…The historical development of the Employment Medical Advisory Service is described, and the Service's present organization is related to its range of…”
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    Journal Article
  17. 17

    Castor bean allergy among workers in the felt industry by Topping, M D, Henderson, R T, Luczynska, C M, Woodmass, A

    Published in Allergy (Copenhagen) (01-11-1982)
    “…We describe occupational allergy to castor bean in workers in a felt manufacturing plant. Twenty-six (37%) of the workers complained they were affected by the…”
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    Journal Article