Search Results - "Henderson, T.S."
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Observation of resonant tunneling at room temperature in GaInP/GaAs/GaInP double-heterojunction bipolar transistor
Published in IEEE transactions on electron devices (01-08-1993)“…Negative differential resistance (NDR) has been observed at room temperature in GaInP/GaAs double-heterojunction bipolar transistors (DHBTs). Both the…”
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On the collapse of drain I-V characteristics in modulation-doped FET's at cryogenic temperatures
Published in IEEE transactions on electron devices (01-08-1984)“…The collapse of the drain current-voltage characteristics of modulation-doped field-effect transistors (MODFET's) at cryogenic temperatures, previously thought…”
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Determination of carrier saturation velocity in high-performance InyGa1-yAs/AlxGa1-xAs modulation-doped field-effect transistors (0 ≤ y ≤ 0.2)
Published in IEEE electron device letters (01-05-1986)“…We describe a new method for determining the carrier saturation velocity υ sat in modulation-doped field-effect transistors (MODFET's). High-performance…”
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Low-noise behavior of InGaAs quantum-well-structured modulation-doped FET's from 10-2to 108Hz
Published in IEEE transactions on electron devices (01-05-1986)“…Equivalent gate noise voltage spectra of 1-µm gate-length modulation-doped FET's with pseudomorphic InGaAs quantum-well structure have been measured for the…”
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The GaAs heterojunction bipolar transistor: an electron device with optical device reliability
Published in Microelectronics and reliability (01-11-1996)“…GaAs-based heterojunction bipolar transistors (HBTs) are of interest for a wide variety of applications. However, concerns about the long-term stability of the…”
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The GaAs heterojunction bipolar transistor: an electron device with optical device reliability
Published in Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (1996)“…GaAs-based heterojunction bipolar transistors (HBTs) are of interest for a wide variety of applications. However, concerns about the long-term stability of the…”
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Low-noise behavior of InGaAs quantum-well-structured modulation-doped FET's from 10 -2 to 10 8 Hz
Published in IEEE transactions on electron devices (01-05-1986)Get full text
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The dependence of 77 K electron velocity-field characteristics on low-field mobility in AlGaAs-GaAs modulation-doped structures
Published in IEEE transactions on electron devices (01-05-1986)“…We have used the geometrical magnetoresistance method to measure the electron velocities and mobilities as functions of electric field in AlGaAs-GaAs…”
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An InAlAs/InGaAs heterojunction bipolar transistor clocked latch on InP
Published in IEEE transactions on electron devices (01-06-1990)“…A clocked latch functioning as a simple comparator with InAlAs/InGaAs heterojunction bipolar transistors (HBTs) on an InP substrate is discussed. Typical…”
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Design of enhanced Schottky-barrier AlGaAs/GaAs MODFET's using highly doped p+surface layers
Published in IEEE transactions on electron devices (01-02-1987)“…The design and performance of enhanced Schottky-barrier height modulation-doped AlGaAs/GaAs field-effect transistors (ESMODFET's) is discussed. Results are…”
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Microwave characterization of (Al,Ga)As/GaAs modulation-doped FET's: Bias dependence of small-signal parameters
Published in IEEE transactions on electron devices (01-10-1984)“…Microwave characterization on 1-µm gate (Al, Ga)As/GaAs modulation-doped field-effect transistors (MODFET's) was done using a network analyzer. Equivalent…”
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Improved reliability self-aligned C/X-band monolithic power HBT amplifiers fabricated with a low-stress process
Published in GaAs IC Symposium IEEE Gallium Arsenide Integrated Circuit Symposium. 18th Annual Technical Digest 1996 (1996)“…We report extensive reliability testing and analysis on GaAs single-finger C/X-band HBTs fabricated for monolithic amplifiers with a low-stress process, The…”
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Conference Proceeding -
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Reliability of self-aligned, ledge passivated 7.5 GHz GaAs/AlGaAs HBT power amplifiers under RF bias stress at elevated temperatures
Published in GaAs IC Symposium IEEE Gallium Arsenide Integrated Circuit Symposium 17th Annual Technical Digest 1995 (1995)“…We report a two-temperature RF bias stress test on nominal 1.2 W 2.5 GHz GaAs/AlGaAs HBT unit cell amplifiers. MTTFs of 2020 and 1340 hours were obtained at…”
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Conference Proceeding -
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Determination of band offsets in AlGaAs/GaAs and InGaAs/GaAs multiple quantum wells
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (01-09-1987)“…The determination of valence band offsets Q v by fitting the optical transmission spectra for Al x Ga1−x As/GaAs and In y Ga1−y As/GaAs multiple quantum wells…”
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The Employment Medical Advisory Service
Published in Postgraduate medical journal (01-06-1990)“…The historical development of the Employment Medical Advisory Service is described, and the Service's present organization is related to its range of…”
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Castor bean allergy among workers in the felt industry
Published in Allergy (Copenhagen) (01-11-1982)“…We describe occupational allergy to castor bean in workers in a felt manufacturing plant. Twenty-six (37%) of the workers complained they were affected by the…”
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