Search Results - "Heeyoul Lee"
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Highly reliable 26nm 64Gb MLC E2NAND (Embedded-ECC & Enhanced-efficiency) flash memory with MSP (Memory Signal Processing) controller
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01-06-2011)“…A highly reliable 26nm 64GB MLC E2NAND (E2: Embedded-ECC & Enhanced-efficiency) flash memory has been successfully developed. To overcome scaling challenges,…”
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Conference Proceeding -
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A middle-1X nm NAND flash memory cell (M1X-NAND) with highly manufacturable integration technologies
Published in 2011 International Electron Devices Meeting (01-12-2011)“…A middle-1x nm design rule multi-level NAND flash memory cell (M1X-NAND) has been successfully developed for the first time. 1) QSPT (Quad Spacer Patterning…”
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Conference Proceeding -
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Highly reliable M1X MLC NAND flash memory cell with novel active air-gap and p+ poly process integration technologies
Published in 2013 IEEE International Electron Devices Meeting (01-12-2013)“…Our Middle-1X nm MLC NAND (M1X) flash cell is intensively characterized with respect to reliability and manufacturability. For the first time, the novel active…”
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Conference Proceeding Journal Article