Search Results - "Hashigutchi, Gen"
-
1
Reflection high-energy electron diffraction intensity oscillations during GexSi1-x MBE growth on Si(001) substrates
Published in Japanese journal of applied physics (01-05-1987)Get full text
Journal Article -
2
Reflection High-Energy Electron Diffraction Intensity Oscillations during Ge x Si 1-x MBE Growth on Si(001) Substrates
Published in Japanese Journal of Applied Physics (01-05-1987)“…Reflection high-energy electron diffraction (RHEED) intensity oscillations during the heteroepitaxy of Ge x Si 1- x on a Si(001) substrate were observed for…”
Get full text
Journal Article