Search Results - "Hashigutchi, Gen"

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    Reflection High-Energy Electron Diffraction Intensity Oscillations during Ge x Si 1-x MBE Growth on Si(001) Substrates by Sakamoto, Kinihiro, Sakamoto, Tsunenori, Nagao, Satoru, Hashigutchi, Gen, Kuniyoshi, Katsuya, Bando, Yoshio

    Published in Japanese Journal of Applied Physics (01-05-1987)
    “…Reflection high-energy electron diffraction (RHEED) intensity oscillations during the heteroepitaxy of Ge x Si 1- x on a Si(001) substrate were observed for…”
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    Journal Article