Search Results - "Harrouche, K."

Thermal and statistical analysis of various AlN/GaN HEMT geometries for millimeter Wave applications by Said, N., Harrouche, K., Medjdoub, F., Labat, N., Tartarin, J.G., Malbert, N.

“…Downscaling HEMT devices is nowadays substantial to allow their operation in the millimeter wave frequency domain. In this work, the electrical parameters of…”
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Short-term reliability of high performance Q-band AlN/GaN HEMTs by Kabouche, R., Harrouche, K., Okada, E., Medjdoub, F.

“…We report on an on-wafer short-term 40 GHz RF reliability stress test comparison up to 140°C base plate temperature between a 3 nm and 4 nm barrier thickness…”
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Role of AlGaN back-barrier in enhancing the robustness of ultra-thin AlN/GaN HEMT for mmWave applications by Said, N., Harrouche, K., Medjdoub, F., Labat, N., Tartarin, J.G., Malbert, N.

“…In this work, the robustness of three different AlN/GaN structures targeting high frequency applications with ultra-thin 3 nm AlN barrier and devices with…”
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Synthesis, characterization and biological evaluation of benzothiazoles and tetrahydrobenzothiazoles bearing urea or thiourea moieties as vasorelaxants and inhibitors of the insulin releasing process by Harrouche, Kamel, Renard, Jean-Francois, Bouider, Nafila, de Tullio, Pascal, Goffin, Eric, Lebrun, Philippe, Faury, Gilles, Pirotte, Bernard, Khelili, Smail

“…A series of 1,3-benzothiazoles (series I) and 4,5,6,7-tetrahydro-1,3-benzothiazoles (series II) bearing an urea or a thiourea moiety at the 2-position were…”
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RF-Robustness enhancement in AlN/GaN HEMT through AlGaN Back-Barrier: nonlinear model analysis by Said, N., Saugnon, D., Harrouche, K., Medjdoub, F., Labat, N., Malbert, N., Tartarin, J-G.

“…In this study, we evaluate the robustness and nonlinear (NL) responses of two variants of AlN/GaN HEMT technology under RF-step stress at 10 GHz. We develop an…”
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Application of signal processing and neural net techniques to ultrasonic characterization of multilayered media by Rouvaen, J.M., Harrouche, K., Ourak, M., El Khaldi, B.

“…The characterization of multilayered media using ultrasonic waves is classically performed using time of flight reflectometry in the pulsed regime or…”
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Thickness measurement of multi-layered structures: a neural net approach by Harrouche, K., Derouiche, Z., Rouvaen, J.M., Delebarre, C.

“…In our laboratory we got some experience about the high frequency characterisation of heteregeneous and multilayered structures. Several tools have been…”
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