Search Results - "Hansel, S.J."
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Update on parts SEE suspectibility from heavy ions
Published in IEEE transactions on nuclear science (01-12-1991)“…Jet Propulsion Laboratory (JPL) and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data (previous sets were…”
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Journal Article -
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Observation of single event upsets in analog microcircuits
Published in IEEE transactions on nuclear science (01-12-1993)“…Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are…”
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Journal Article Conference Proceeding -
3
Comparative SEU sensitivities to relativistic heavy ions
Published in IEEE transactions on nuclear science (01-12-1998)“…SEU sensitivity of microcircuits to relativistic heavy ions is compared to that measured with low energy ions of comparable LET values. Multiple junction…”
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4
Single event effects in pulse width modulation controllers
Published in IEEE transactions on nuclear science (01-12-1996)“…SEE testing was performed on pulse width modulation (PWM) controllers which are commonly used in switching mode power supply systems. The devices are designed…”
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The SAMPEX data processing unit
Published in IEEE transactions on geoscience and remote sensing (01-05-1993)“…A description is given of the SAMPEX (Solar, Anomalous, and Magnetospheric Particle Explorer) data processing unit, which provides overall control of the…”
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The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space
Published in IEEE transactions on nuclear science (01-12-1996)“…Digital signal processors (DSPs) sensitive to SEE may be utilized in some space-borne systems, in which the effects of cosmic-rays and trapped protons are…”
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Serendipitous SEU hardening of resistive load SRAMs
Published in IEEE transactions on nuclear science (01-06-1996)“…High and low resistive load versions of Micron Technology's MT5C1008C (128K/spl times/8) and MT5C2561C (256K/spl times/1) SRAMs were tested for SEU…”
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Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices
Published in IEEE transactions on nuclear science (01-12-1995)“…This paper presents single event upset (SEU) and latchup test results for selected Emitter Coupled Logic (ECL) microcircuits, including several types of low…”
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The impact of ASIC devices on the SEU vulnerability of space-borne computers
Published in IEEE transactions on nuclear science (01-12-1992)“…Application-specific integrated circuits (ASICs) offer a number of advantages over traditional multicomponent microcircuits, including reductions in both size…”
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Journal Article Conference Proceeding -
10
Update on parts SEE susceptibility from heavy ions
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01-12-1991)“…Jet Propulsion Laboratory (JPL) and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data (previous sets were…”
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Journal Article Conference Proceeding -
11
SEU and latchup tolerant advanced CMOS technology
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01-12-1990)“…Selected microcircuits constructed in National Semiconductor's FACT (Fairchild advanced CMOS technology) were tested for heavy-ion-induced single event upset…”
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Journal Article Conference Proceeding -
12
Serendipitous SEU hardening of resistive load SRAMs
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)“…High and low resistive load versions of Micron Technology's MT5C1008C(128 K/spl times/8) and MT5C2561C(256 K/spl times/1) SRAMs were tested for SEU…”
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Conference Proceeding
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The SEU in pulse width modulation controllers with soft start and shutdown circuits
Published in 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (1997)“…A study was done of Single Event Upset (SEU) in pulse width modulation (PWM) controllers which feature either soft start or shutdown circuits. Upsets occurring…”
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Conference Proceeding -
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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors
Published in 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) (1998)“…Two generations of the 80Cx86 microprocessor family and two floating-point digital signal processor (DSP) of the SMJ320Cx0 family were tested for single event…”
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Conference Proceeding -
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Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor
Published in 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) (2000)“…It has been observed that the 68302 microprocessor, which is being flown on several space vehicles, has not shown signs of experiencing either single event…”
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Conference Proceeding -
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Overview Of Device See Susceptibility From Heavy Ions
Published in 1993 IEEE Radiation Effects Data Workshop (1993)Get full text
Conference Proceeding