Search Results - "Haniotakis, T."
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A Methodology for Transistor-Efficient Supergate Design
Published in IEEE transactions on very large scale integration (VLSI) systems (01-04-2007)“…The number of transistors required for the implementation of a logic function is a fundamental consideration in digital VLSI design. While the determination of…”
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2
A Design Technique for Energy Reduction in NORA CMOS Logic
Published in IEEE transactions on circuits and systems. I, Regular papers (01-12-2006)“…In this work, a design technique to reduce the energy consumption in NO RAce (NORA) circuits is presented. The technique is based on a unidirectional switch…”
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3
Testable Designs of Multiple Precharged Domino Circuits
Published in IEEE transactions on very large scale integration (VLSI) systems (01-04-2007)“…Domino CMOS circuits are an option for speeding up critical units. An inherent problem of Domino logic is that under specific input conditions the charge…”
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4
A unified framework for generating all propagation functions for logic errors and events
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01-06-2004)“…We present a generic framework that supports efficient generation of the traditional Boolean difference function of some output with respect to any line in a…”
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5
Memory write speed up via multi voltage driver on CeidMem Library
Published in Microelectronic engineering (01-09-2016)“…A speedup technique for the write function of static memories, achieved via multi voltage manipulation, is presented. The designs created to support this…”
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6
CeidMem: A compact Static Memory Library
Published in Journal of engineering science and technology review (01-08-2016)Get full text
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7
Efficient totally self-checking checkers for a class of Borden codes
Published in IEEE transactions on computers (01-11-1995)“…In this paper a new method to design totally self-checking (TSC) checkers for a class of Borden codes is given and their applicability is discussed. The TSC…”
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Path delay fault testing of ICs with embedded intellectual property blocks
Published in Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) (1999)“…In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary…”
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Conference Proceeding -
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Security enhancement through multiple path transmission in ad hoc networks
Published in 2004 IEEE International Conference on Communications (IEEE Cat. No.04CH37577) (2004)“…We propose a novel way to further secure the data transmitted along routes of a wireless ad hoc network, after a potentially secure connection has been…”
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10
Testable designs of one-count generators
Published in International journal of electronics (01-11-1998)“…Testable realizations of One-Count Generators (OCGs) with respect to an extended fault model, including the stuck-at, transistor stuck-open, and transistor…”
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11
Design and evaluation of a security scheme for sensor networks
Published in Sixth international symposium on quality electronic design (isqed'05) (2005)“…A keyless methodology to ensure secure data transmission in a network of sensors is presented. The main feature is the low power consumption due to the…”
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12
Fast, parallel two-rail code checker with enhanced testability
Published in 11th IEEE International On-Line Testing Symposium (2005)“…A current mode, periodic outputs, parallel two-rail code (TRC) checker, suitable for high n-variable (high fan-in) implementations, is presented. The checker…”
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13
A new dynamic circuit design technique for high performance TSC checker implementations [totally self checking circuits]
Published in Proceedings. 10th IEEE International On-Line Testing Symposium (2004)“…The use of a fault model that handles transistor level faults like transistor stuck-open and transistor stuck-on is highly desirable in modern designs…”
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14
A hierarchical architecture for concurrent soft error detection based on current sensing
Published in Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) (2002)“…Robust circuit design techniques with respect to soft errors gain importance in the era of very deep submicron technologies. On-line testing will play an…”
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15
A Current Mode, Parallel, Two-Rail Code Checker
Published in IEEE transactions on computers (01-08-2008)“…A current mode, periodic outputs, parallel two-rail code (TRC) checker, suitable for the implementation of high fan-in embedded checkers, is presented. The new…”
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16
A low power NORA circuit design technique based on charge recycling
Published in 10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 (2003)“…In this paper we present a low power oriented design technique for NORA clocked circuits. This technique is based on a new switching scheme for charge…”
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Conference Proceeding -
17
Concurrent detection of soft errors based on current monitoring
Published in Proceedings Seventh International On-Line Testing Workshop (2001)“…Transient faults in future ICs turns to be a major consideration as the silicon process scales down. In this paper we propose a new soft error detecting…”
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18
New test pattern generation units for NPSF oriented memory built-in self test
Published in ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) (2001)“…In this paper we present the design of deterministic test pattern generation (TPG) units which can be exploited in a built-in self-test (BIST) scheme for…”
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19
A Metric for Weight Assignment to Optimize the Performance of MOBILE Threshold Logic Gate
Published in 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (01-10-2011)“…The first contribution of the proposed approach is to characterize the temporal behavior of a MOBILE threshold logic gate. Subsequently, we derive a simplified…”
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20
New memory sense amplifier designs in CMOS technology
Published in ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) (2000)“…In this paper two-stage sense amplifier designs are proposed which are suitable for current sensing in SRAM and flash memories read operations. The first-stage…”
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Conference Proceeding