Search Results - "Hamrlová, J."

Selective sensitivity of ellipsometry to magnetic nanostructures by Postava, K., Hrabovský, D., Hamrlová, J., Pištora, J., Wawro, A., Baczewski, L.T., Sveklo, I., Maziewski, A.

“…Magneto-optic (MO) ellipsometry of ferromagnetic materials is extremely sensitive to ultra-thin films, multilayers, and nanostructures. It gives a possibility…”
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Ellipsometric Selective Sensitivity to Magnetic Nanostructures by Hamrlová, J., Postava, K., Životský, O., Hrabovský, D., Pištora, J., Švec, P., Janičkovič, D., Maziewski, A.

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