Search Results - "Hamida, N.B."

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  1. 1

    Closing the gap between analog and digital testing by Saab, K., Hamida, N.B., Kaminska, B.

    “…This paper presents a highly effective method for parallel hard fault simulation and test-specification development. The proposed method formulates the…”
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    Journal Article
  2. 2

    Closing the gap between analog and digital by Saab, Khaled, Hamida, Naim Ben, Kaminska, Bozena

    “…This paper presents a highly effective method for parallel hard fault simulation and test specification development. The proposed method formulates the fault…”
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    Conference Proceeding
  3. 3

    A uniform testability measures representation for sequential and combinational circuits by Hamida, N.B., Kaminska, B.

    “…The authors present an efficient method for computing uniform testability measures for combinational and sequential circuits. The initiability measure is a…”
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    Conference Proceeding
  4. 4

    LIMSoft: automated tool for design and test integration of analog circuits by Hamida, N.B., Saab, K., Marche, D., Kaminska, B., Quesnel, G.

    “…Integrating design and test presents a good challenge in today's analog circuit manufacturing process. Designs should be made according to the sensitivity of…”
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    Conference Proceeding
  5. 5

    A novel A/D converter for high-resolution and high-speed applications by Ehsanian, M., Hamida, N.B., Kaminska, B.

    “…This paper describes a new and novel subranging analog-to-digital converter based on parallel comparison and subtraction. A high-resolution and high-speed…”
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    Conference Proceeding
  6. 6

    Analog circuit testing based on sensitivity computation and new circuit modeling by Hamida, N.B., Kaminska, B.

    “…Analog circuit testing is considered to be a very difficult task, due mainly to the lack of fault models and accessibility to internal nodes. An approach is…”
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    Conference Proceeding Journal Article
  7. 7

    Initiability: A Measure Of Sequential Testability by Hamida, N.B., Kaminska, B., Savaria, Y.

    “…The testing of sequential circuit is difficult when problems occur concerning setting their initial state and checking their final state after test. The…”
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    Conference Proceeding