Search Results - "Hamida, N.B."
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Closing the gap between analog and digital testing
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01-02-2001)“…This paper presents a highly effective method for parallel hard fault simulation and test-specification development. The proposed method formulates the…”
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Journal Article -
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Closing the gap between analog and digital
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 37th conference on Design automation; 05-09 June 2000 (01-06-2000)“…This paper presents a highly effective method for parallel hard fault simulation and test specification development. The proposed method formulates the fault…”
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Conference Proceeding -
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A uniform testability measures representation for sequential and combinational circuits
Published in 1991 IEEE International Symposium on Circuits and Systems (ISCAS) (1991)“…The authors present an efficient method for computing uniform testability measures for combinational and sequential circuits. The initiability measure is a…”
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Conference Proceeding -
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LIMSoft: automated tool for design and test integration of analog circuits
Published in Proceedings International Test Conference 1996. Test and Design Validity (1996)“…Integrating design and test presents a good challenge in today's analog circuit manufacturing process. Designs should be made according to the sensitivity of…”
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Conference Proceeding -
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A novel A/D converter for high-resolution and high-speed applications
Published in 1997 IEEE International Symposium on Circuits and Systems (ISCAS) (1997)“…This paper describes a new and novel subranging analog-to-digital converter based on parallel comparison and subtraction. A high-resolution and high-speed…”
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Conference Proceeding -
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Analog circuit testing based on sensitivity computation and new circuit modeling
Published in Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (1993)“…Analog circuit testing is considered to be a very difficult task, due mainly to the lack of fault models and accessibility to internal nodes. An approach is…”
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Conference Proceeding Journal Article -
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Initiability: A Measure Of Sequential Testability
Published in 1993 IEEE International Symposium on Circuits and Systems (ISCAS) (01-05-1993)“…The testing of sequential circuit is difficult when problems occur concerning setting their initial state and checking their final state after test. The…”
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Conference Proceeding