Search Results - "Hamad, Ghaith Bany"

System-Level Analysis of the Vulnerability of Processors Exposed to Single-Event Upsets via Probabilistic Model Checking by Ammar, Marwan, Bany Hamad, Ghaith, Ait Mohamed, Otmane, Savaria, Yvon

“…Due to current technology scaling trends, digital designs are becoming strongly susceptible to space radiation effects. These effects can cause unwanted…”
Get full text

Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-Trees (TDFTs) by Ammar, Marwan, Bany Hamad, Ghaith, Ait Mohamed, Otmane, Savaria, Yvon

“…Fault tree (FT) is a standardized notation for representing relationships between a system's reliability and the faults and/or the events associated with it…”
Get full text

Routing and Scheduling of Time-Triggered Traffic in Time-Sensitive Networks by Atallah, Ayman A., Hamad, Ghaith Bany, Mohamed, Otmane Ait

“…This article addresses the following research question: How to compute no-wait schedules and multipath routings for large-scale time-sensitive networks (TSNs)?…”
Get full text

Towards Safe and Robust Closed-Loop Artificial Pancreas Using Improved PID-Based Control Strategies by Alshalalfah, Abdel-Latif, Hamad, Ghaith Bany, Mohamed, Otmane Ait

“…Artificial pancreas enhances the life experience for diabetic patients by allowing them to live normally with their glucose levels controlled automatically…”
Get full text

Domain-Adapted LLMs for VLSI Design and Verification: A Case Study on Formal Verification by Liu, Mingjie, Kang, Minwoo, Hamad, Ghaith Bany, Suhaib, Syed, Ren, Haoxing

“…Large language models (LLMs) present unprecedented opportunities in task automation for industrial chip design and verification that can yield significant…”
Get full text

New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic by Hamad, Ghaith Bany, Hasan, Syed Rafay, Mohamed, Otmane Ait, Savaria, Yvon

“…An investigation of the Single Event Transient (SET) characteristics (amplitude and width) variation while propagating through static and True Single Phase…”
Get full text

Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits by Bany Hamad, Ghaith, Hasan, Syed Rafay, Ait Mohamed, Otmane, Savaria, Yvon

“…•Analysis of soft error propagation in asynchronous and synchronous digital designs.•Modeling electrical and logical masking at gate level by utilizing MDG and…”
Get full text

New Insights Into Soft-Faults Induced Cardiac Pacemakers Malfunctions Analyzed at System-Level via Model Checking by Hamad, Ghaith Bany, Ammar, Marwan, Mohamed, Otmane Ait, Savaria, Yvon

“…Progressive shrinking of CMOS device sizes has permitted reductions in power consumption and miniaturization of electronic devices. In parallel, modern…”
Get full text

Abstracting Single Event Transient characteristics variations due to input patterns and fan-out by Bany Hamad, Ghaith, Hasan, Syed Rafay, Ait Mohamed, Otmane, Savaria, Yvon

“…Due to shrinking feature sizes and significant reduction in noise margins, as CMOS technologies evolve toward ultra-deep sub-micron, digital circuits have…”
Get full text

Fault-Resilient Topology Planning and Traffic Configuration for IEEE 802.1Qbv TSN Networks by Atallah, Ayman A., Hamad, Ghaith Bany, Mohamed, Otmane Ait

“…Time-Sensitive Networking (TSN) is a set of IEEE standards that are being developed to enable a reliable and real-time communication based on Ethernet…”
Get full text

Identification of soft error glitch-propagation paths: Leveraging SAT solvers by Hamad, Ghaith Bany, Ait Mohamed, Otmane, Hasan, Syed Rafay, Savaria, Y.

“…Increase in vulnerability to soft errors has affected the reliability of both synchronous and asynchronous circuits implemented in modern deep sub-micron…”
Get full text

Towards System Level Security Analysis of Artificial Pancreas Via UPPAAL-SMC by Alshalalfah, Abdel-Latif, Hamad, Ghaith Bany, Mohamed, Otmane Ait

“…The reliability of artificial pancreas is crucial for the safety and security of type 1 diabetes. In this paper, new modeling and analysis of the closed-loop…”
Get full text

Efficient and accurate analysis of Single Event Transients propagation using SMT-based techniques by Hamad, Ghaith Bany, Kazma, Ghaith, Mohamed, Otmane Ait, Savaria, Yvon

“…This paper presents a hierarchical framework to model, analyze, and estimate digital design vulnerability to soft errors due to Single Event Transients (SETs)…”
Get full text

Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits by Hamad, Ghaith Bany, Ait Mohamed, Otmane, Savaria, Yvon

“…Recent radiation ground testing campaigns of digital designs have demonstrated that the probability for Single Event Transient (SET) propagation is increasing…”
Get full text

Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems by Bany Hamad, Ghaith

“…The exponential growth in the number of transistors per chip brought tremendous progress in the performance and the functionality of semiconductor devices…”
Get full text

Detecting Malicious Ethereum Entities via Application of Machine Learning Classification by Poursafaei, Farimah, Hamad, Ghaith Bany, Zilic, Zeljko

“…Malicious activities such as scams and frauds have imposed high costs for financial systems. The advent of blockchain-based cryptocurrencies such as Ethereum…”
Get full text

Modeling, analyzing, and abstracting single event transient propagation at gate level by Hamad, Ghaith Bany, Hasan, Syed Rafay, Mohamed, Otmane Ait, Savaria, Yvon

“…Soft errors have become one of the most challenging issues that impact the reliability of modern microelectronic systems at terrestrial altitudes. A new…”
Get full text

FVEval: Understanding Language Model Capabilities in Formal Verification of Digital Hardware by Kang, Minwoo, Liu, Mingjie, Hamad, Ghaith Bany, Suhaib, Syed, Ren, Haoxing

“…The remarkable reasoning and code generation capabilities of large language models (LLMs) have spurred significant interest in applying LLMs to enable task…”
Get full text

Layout-based Vulnerability Analysis of LEON3 Processor to Single Event Multiple Transients using Satisfiability Modulo Theories by Nethula, Sowmith, Bansal, Vivek, Hamad, Ghaith Bany, Ait Mohamed, Otmane

“…With the reduction in transistor size, the radiation-induced soft error phenomenon in electronic circuits has become a significant reliability concern. In…”
Get full text

System level SEUs propagation analysis via data flow-based reduction and quantitative model checking by Hamad, Ghaith Bany, Mohamed, Otmane Ait

“…Reliability is considered as one of the primary design requirements in embedded systems. Soft errors induced by radiation jeopardize system performance and…”
Get full text