Search Results - "Ham, Ilsik"

Optimal dummy word line condition to suppress hot carrier injection phenomenon due to the natural local self-boosting effect in 3D NAND flash memory by Jeong, Youngseok, Ham, Ilsik, Han, Sangwoo, Kang, Myounggon

“…The main cell channel in 3D NAND flash structures easily goes into the floating state, because it is not directly connected to the substrate, resulting in the…”
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Comparison of Various Factors Affected TID Tolerance in FinFET and Nanowire FET by Won, Hyeonjae, Ham, Ilsik, Jeong, Youngseok, Kang, Myounggon

“…Analysis of the radiation effects in a device is of great importance. The gate all around (GAA) structure that contributes to device scaling not only solves…”
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