Search Results - "Hajlasz, M."

Characterization of recessed Ohmic contacts to AlGaN/GaN by Hajlasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R., Schmitz, J.

“…In this work the choice of appropriate test structures and characterization methods for recessed Ohmic contacts to AlGaN/GaN is discussed. It is shown that, in…”
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Sheet resistance under Ohmic contacts to AlGaN/GaN heterostructures by Hajłasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R., Schmitz, J.

“…For the determination of specific contact resistance in semiconductor devices, it is usually assumed that the sheet resistance under the contact is identical…”
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