Search Results - "Hacke, Peter L."

Use of indentation to study the degradation of photovoltaic backsheets by Miller, David C., Owen-Bellini, Michael, Hacke, Peter L.

“…The ability of electrical insulating materials within a module to act as insulators is a key safety requirement for photovoltaic (PV) technology. Presently,…”
Get full text

Degradation in photovoltaic encapsulant transmittance: Results of the first PVQAT TG5 artificial weathering study by Miller, David C., Bokria, Jayesh G., Burns, David M., Fowler, Sean, Gu, Xiaohong, Hacke, Peter L., Honeker, Christian C., Kempe, Michael D., Köhl, Michael, Phillips, Nancy H., Scott, Kurt P., Singh, Ashish, Suga, Shigeo, Watanabe, Shin, Zielnik, Allen F.

“…Reduced optical transmittance of encapsulants resulting from ultraviolet (UV) degradation is frequently identified as a cause of decreased performance through…”
Get full text

Photovoltaic Cable Connectors: A Comparative Assessment of the Present State of the Industry by Miller, David C., Arnold, Rachael L., Hacke, Peter L., Jiang, Chun-Sheng, Hayden, Steven C., Moutinho, Helio, Newkirk, Jimmy M., Perrin, Greg, Schelhas, Laura T., Terwilliger, Kent, Ulicna, Sona, Xiao, Chuanxiao

“…The consequences of failure for balance-of-systems components (such as photovoltaic (PV) cable connectors) include offline module string(s); low system…”
Get full text

Use of indentation to study the degradation of photovoltaic backsheets by Miller, David C., Owen-Bellini, Michael, Hacke, Peter L.

“…The ability of electrical insulating materials within a module to act as insulators is a key safety requirement for photovoltaic (PV) technology. Presently,…”
Get full text

Diagnosis of PV Cell Passivation Degradation Resulting from Hot-Humid, High Voltage Potential Aging by Miller, David C., Arnold, Rachael L., Gaulding, Ashley, Hacke, Peter L., Hayden, Steven C., Johnston, Steve, Jungjohann, Katherine, Mangum, John, Teeter, Glenn, Terwilliger, Kent, Wall, Weston

“…Corrosion of the antireflective coating on the cell ("AR c corrosion") was previously observed in studies using hot-humid test conditions with external high…”
Get full text

Degradation in PV encapsulation transmittance: An interlaboratory study towards a climate-specific test by Miller, David C., Annigoni, Eleonora, Ballion, Amal, Bokria, Jayesh G., Bruckman, Laura S., Burns, David M., Xinxin Chen, Elliott, Lamont, Jiangtao Feng, French, Roger H., Fowler, Sean, Xiaohong Gu, Hacke, Peter L., Honeker, Christian C., Kempe, Michael D., Khonkar, Hussam, Kohl, Michael, Perret-Aebi, Laure-Emmanuelle, Phillips, Nancy H., Scott, Kurt P., Sculati-Meillaud, Fanny, Shioda, Tsuyoshi, Suga, Shigeo, Watanabe, Shin, Wohlgemuth, John H.

“…Reduced optical transmittance of encapsulants resulting from ultraviolet (UV) degradation has frequently been identified as a cause of decreased PV module…”
Get full text

Combined-Accelerated Stress Testing System for Photovoltaic Modules by Spataru, Sergiu, Hacke, Peter L, Owen-Bellini, Michael

“…Combining the stress factors of the natural environment into a single test for photovoltaic modules requires fewer modules, fewer parallel tests, and makes it…”
Get full text

Effects of Reactive Power on Photovoltaic Inverter Reliability and Lifetime by Thiagarajan, Ramanathan, Nagarajan, Adarsh, Hacke, Peter, Repins, Ingrid

“…This paper performs research on predicting Photovoltaic (PV) inverters reliability and lifetime based on thermal cycling. Thermal cycling is considered the…”
Get full text

Analysis of the Long-Term Performance Degradation of Crystalline Silicon Photovoltaic Modules in Tropical Climates by Luo, Wei, Khoo, Yong Sheng, Hacke, Peter L, Jordan, Dirk, Zhao, Lu, Ramakrishna, Seeram, Aberle, Armin G., Reindl, Thomas

“…For this study, the long-term performance degradation of five different types of commercial crystalline silicon (c-Si) photovoltaic (PV) modules (one sample…”
Get full text

Validation of Advanced Photovoltaic Module Materials and Processes by Combined-Accelerated Stress Testing (C-AST) by Hartman, Katy, Hacke, Peter, Owen-Bellini, Michael, Jin, Yang, Cummings, Malcolm, Taylor, Al, Pretorius, Jaco, Fritzemeier, Les

“…Tessolar module technology was developed to allow the incorporation of 5 incremental module material innovations. Combined, these innovations may improve the…”
Get full text

Correction for Metastability in the Quantification of PID in Thin-Film Module Testing by Hacke, Peter, Spataru, Sergiu, Johnston, Steve

“…A fundamental change in the analysis for the accelerated stress testing of thin-film modules is proposed, whereby power changes due to metastability and other…”
Get full text

Comparison of PID Shunting in Polycrystalline and Single-Crystal Silicon Modules via Multi-Scale, Multi-Technique Characterization by Harvey, Steven P., Sulas, Dana, Hacke, Peter, Johnston, Steve, Al-Jassim, Mowafak

“…We used the methods we reported last year to investigate potential-induced degradation (PID). We have now applied these methods to single-crystalline silicon…”
Get full text

Reproducing the "Framing" by a Sequential Stress Test by Tanahashi, Tadanori, Owen-Bellini, Michael, Hacke, Peter, Sakurai, Keiichiro, Shioda, Tsuyoshi, Gambogi, William, Phillips, Nancy H., Roy Choudhury, Kaushik, Spataru, Sergiu, Miller, David C., Kempe, Michael

“…The "Framing" (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors)…”
Get full text

Understanding PV Polymer Backsheet Degradation through X-ray Scattering by Moffitt, Stephanie L., Hacke, Peter, Dauskardt, Reinhold H., Schelhas, Laura T., Yan Yuen, Pak, Owen-Bellini, Michael, Miller, David C., Jenket, Donald R., Maes, Ashley M., Hartley, James Y., Sinha, Archana, Karin, Todd

“…Understanding how photovoltaic (PV) module backsheet polymers age and degrade in response to environmental stresses is important for designing polymers that…”
Get full text

Correlation of advanced accelerated stress testing with polyamide-based photovoltaic backsheet field-failures by Owen-Bellini, Michael, Miller, David C., Schelhas, Laura T., Moffitt, Stephanie L., Jenket, Donald R., Maes, Ashley M., Hartley, James Y., Karin, Todd, Hacke, Peter

“…Cracking of polyamide (PA)-based photovoltaic (PV) backsheet materials has been widely reported for field-aged modules. Failure was not detected by…”
Get full text

Investigating PID Shunting in Polycrystalline Silicon Modules via Multi-Scale, Multi-Technique Characterization by Harvey, Steven P., Moseley, John, Stokes, Adam, Norman, Andrew, Gorman, Brian, Hacke, Peter, Johnston, Steve, Al-Jassim, Mowafak

“…Here we present a method for calculating the TCO sheet resistance of complete thin film modules using EL imaging. The method uses the characteristic decay of…”
Get full text

Photoluminescence-imaging-based Evaluation of Non-uniform CdTe Degradation by Johnston, Steve, Albin, David, Hacke, Peter, Harvey, Steven P., Moutinho, Helio, Al-Jassim, Mowafak, Metzger, Wyatt K.

“…A control algorithm is designed to smooth the variability of PV power output using distributed batteries. The tradeoff between smoothing and battery size is…”
Get full text

Large-Area Junction Damage in Potential-Induced Degradation of c-Si Solar Modules by Chuanxiao Xiao, Chun-Sheng Jiang, Johnston, Steve, Harvey, Steve P., Hacke, Peter, Gorman, Brian, Al-Jassim, Mowafak

“…We report a large area of millimeter-scale p-n junction damage caused by potential-induced degradation (PID) of lab-stressed crystalline-Si modules. Kelvin…”
Get full text

Evaluation of the PID-s susceptibility of modules encapsulated in materials of varying resistivity by Habersberger, Brian M., Hacke, Peter, Madenjian, Lisa S.

“…A common mechanism of potential-induced degradation is by shunting (PID-s) in PV modules, usually associated with the transport of sodium ions (Na+ through the…”
Get full text

Prediction of Potential-Induced Degradation Rate of Thin-Film Modules in the Field Based on Coulombs Transferred by Hacke, Peter, Johnston, Steve, Luo, Wei, Spataru, Sergiu, Smith, Ryan, Repins, Ingrid

“…We validated the use of coulombs transferred between the active cell circuit and ground as an index for quantitatively predicting degradation rate in the field…”
Get full text