Search Results - "HATZISTERGOS, M. S"

X-ray reflectometry analyses of chromium thin films by Matyi, R.J., Hatzistergos, M.S., Lifshin, E.

“…A series of thin (less than 100 nm) chromium films on Si and SiO2/Si substrates has been examined using X-ray reflectometry (XRR) and cross-section scanning…”
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Microstructural and compositional analysis of YBa2Cu3O7-δ films grown by MOCVD before and after GCIB smoothing by HATZISTERGOS, M. S, EFSTATHIADIS, H, REEVES, J. L, SELVAMANICKAM, V, ALLEN, L. P, LIFSHIN, E, HALDAR, P

“…The microstructural and compositional evolution of thick ( > 1 mum) high temperature superconducting YBa2Cu3O7-x (YBCO) films grown on single crystal SrTiO3…”
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Microstructural and electrical characterization of gas cluster ion beam-smoothed YBCO films by Hatzistergos, M.S., Efstathiadis, H., Lifshin, E., Kaloyeros, A.E., Reeves, J.L., Selvamanickam, V., Allen, L.P., MacCrimmon, R.

“…The decrease in the critical current density (J/sub c/) of YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) films with increasing film thickness was investigated for 0.2 -…”
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