A merged-beam setup at SOLEIL dedicated to photoelectron–photoion coincidence studies on ionic species

A merged-beam setup at SOLEIL dedicated to photoelectron–photoion coincidence studies on ionic species

•Description of a merged-beam setup at SOLEIL synchrotron radiation facility.•Unique setup of this kind allowing photoelectron spectroscopy on ionic species.•Use of electron-ion coincidence to reduce the background.•Examples on the photoionization of Xe5+ multiply-charged ion. We describe the merged...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena Vol. 210; pp. 5 - 12
Main Authors: Bizau, J.M., Cubaynes, D., Guilbaud, S., El Eassan, N., Al Shorman, M.M., Bouisset, E., Guigand, J., Moustier, O., Marié, A., Nadal, E., Robert, E., Nicolas, C., Miron, C.
Format: Journal Article
Language:English
Published: Elsevier B.V 01-07-2016
Elsevier
Subjects:
Cross sections
Electron spectroscopy
Ions
Merged beam
Molecular ions
Photoionization
Photons
Physics
Spectra
Spectrometry
Synchrotron radiation
Ions
Electron spectroscopy
Merged beam
Photoionization
Synchrotron radiation
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Description
Summary:•Description of a merged-beam setup at SOLEIL synchrotron radiation facility.•Unique setup of this kind allowing photoelectron spectroscopy on ionic species.•Use of electron-ion coincidence to reduce the background.•Examples on the photoionization of Xe5+ multiply-charged ion. We describe the merged-beam setup permanently installed on a dedicated optical branch of the PLEIADES beamline at SOLEIL, the French synchrotron radiation facility in St-Aubin, delivering photons in the 10–1000eV photon energy range. The setup is designed both for photoion and photoelectron spectroscopy experiments on atomic and molecular ions. Ion spectrometry is dedicated to the determination of absolute single and multiple photoionization cross sections. Electron spectroscopy brings additional information on the non-radiative decay of inner-vacancies produced in the photoionization processes and allows for the determination of partial cross sections. Efficient reduction of the background in the electron spectra is achieved by the use of the electron-ion coincidence technique. Examples of photoion and photoelectron spectra are given for the Xe5+ ion.
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ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2016.03.006