Search Results - "Guhabiswas, D"

A reflectance spectroscopy-based tool for high-speed characterization of silicon wafers and solar cells in commercial production by Sopori, B, Rupnowski, P, Guhabiswas, D, Devayajanam, S, Shet, S, Khattak, C P, Albert, M

“…Some new applications of reflectance spectroscopy using the GT FabScan are described, which make this system highly desirable for process monitoring in…”
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A new method for rapid measurement of orientations and sizes of grains in multicrystalline silicon wafers by Sopori, Bhushan, Guhabiswas, D., Rupnowski, P., Shet, S., Devayajanam, S., Moutinho, H.

“…We describe a new technique for rapid measurement of orientations and sizes of various grains in a multicrystalline silicon (mc-Si) wafer. The wafer is texture…”
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Characterizing damage on Si wafer surfaces cut by slurry and diamond wire sawing by Sopori, Bhushan, Devayajanam, Srinivas, Shet, Sudhakar, Guhabiswas, Debraj, Basnyat, Prakash, Moutinho, Helio, Gedvilas, Lynn, Jones, Kim, Binns, Jeff, Appel, Jesse

“…We have measured and compared surface roughness and the degree of damage for wafers cut by three different sawing techniques - slurry, Ni-based diamond wire,…”
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Extension of PV Optics to include front metallization by Guhabiswas, Debraj, Sopori, Bhushan, Rivero, Rene, Ravindra, N. M.

“…PV Optics is an optical design package that was developed about a decade ago and has been extensively used since then for design of c-Si, and multijunction…”
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Formation of a back contact by fire-through process of screen-printed silicon solar cells by Sopori, B., Mehta, V., Guhabiswas, D., Reedy, R., Moutinho, H., To, B., Shaikh, A., Rangappan, A.

“…We have investigated various mechanisms that participate in formation of a good, screen-printed, Si-Al contact on the back side of a crystalline-Si solar cell…”
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