Search Results - "Grimaila, M.R."

Defect-oriented testing and defective-part-level prediction by Dworak, J., Wicker, J.D., Lee, S., Grimaila, M.R., Mercer, M.R., Butler, K.M., Stewart, B., Wang, L.-C.

“…After an integrated circuit (IC) design is complete, but before first silicon arrives from the manufacturing facility, the design team prepares a set of test…”
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Improving Satellite Multicast Security Scalability by Reducing Rekeying Requirements by Hubenko, V.P., Raines, R.A., Baldwin, R.O., Mullins, B.E., Mills, R.F., Grimaila, M.R.

“…As multicasting technologies grow in popularity, so does the need for scalable security architectures to support the user base. Significant research efforts…”
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Enterprise computing: economies and diseconomies of scale in server price/performance relationships by Anderson, E., Grimaila, M.R., Richmond, W.

“…It has been long held that computer systems exhibit economies of scale (Grosch's law) and that their price increases with performance, but at a decreasing…”
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An Enterprise Level Security Requirements Specification Model by Anderson, E., Choobineh, J., Grimaila, M.R.

“…A formal model of security requirements for enterprise information technology protection is developed. The model is based on set theory and represented using…”
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Maximizing business information security's educational value by Grimaila, M.R.

“…A business information security course's goals and objectives are quite different from most traditional security courses, which focus on designing and…”
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An optimal test pattern selection method to improve the defect coverage by Yuxin Tian, Grimaila, M.R., Weiping Shi, Mercer, M.R.

“…It is well known that n-detection test sets are effective to detect unmodeled defects and improve the defect coverage. However, in these sets, each of the…”
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REDO-random excitation and deterministic observation-first commercial experiment by Grimaila, M.R., Sooryong Lee, Dworak, J., Butler, K.M., Stewart, B., Balachandran, H., Houchins, B., Mathur, V., Jaehong Park, Wang, L.-C., Mercer, M.R.

“…For many years, non-target detection experiments have been simulated by using AND/OR bridges or gross delay faults as surrogates. For example, the defective…”
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A new ATPG algorithm to limit test set size and achieve multiple detections of all faults by Sooryong Lee, Cobb, B., Dworak, J., Grimaila, M.R., Mercer, M.R.

“…Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple…”
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Improving the Global Information Grid's Performance through Satellite Communications Layer Enhancements by Hubenko, Victor P., Raines, Richard A., Mills, Robert F., Baldwin, Rusty O., Mullins, Barry E., Grimaila, Michael R.

“…With the information age in full and rapid development, users are becoming accustomed to having immediate access to information. Users demand more capabilities…”
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Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D by Dworak, J., Grimaila, M.R., Sooryong Lee, Wang, L.-C., Mercer, M.R.

“…Predicting the final value of the defective part level after the application of a set of test vectors is not a simple problem. In order for the defective part…”
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Towards an Information Asset-Based Defensive Cyber Damage Assessment Process by Grimaila, M.R., Fortson, L.W.

“…The use of computers and communication technologies to enhance command and control (C2) processes has yielded enormous benefits in military operations…”
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On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction by Dworak, J., Grimaila, M.R., Cobb, B., Wang, T.-C., Wang, L.-C., Mercer, M.R.

“…Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect…”
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Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies by Dworak, J., Grimaila, M.R., Lee, S., Wang, L.-C., Mercer, M.R.

“…If many potential defects exist at each site in an integrated circuit, then as the number of applied test patterns increases, the number of defects which…”
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A macromodel fault generator for cellular neural networks by Grimaila, M.R., de Gyvez, J.P.

“…A CAD tool based on SPICE macromodels to simulate simplified faulty, circuit realizations of a fully programmable, two dimensional cellular neural network…”
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Robust functional testing for VLSI cellular neural network implementations by Grimaila, M.R., de Gyvez, J.P., Gunhee Han

“…A robust testing method for detecting circuit faults within two-dimensional Cellular Neural Network (CNN) arrays is presented. The functional tests consist of…”
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Improving the Global Information Grid¿s Performance through Satellite Communications Layer Enhancements by Hubenko, V.P, Raines, R.A, Mills, R.F, Baldwin, R.O, Mullins, B.E, Grimaila, M.R

“…[...] we show how multicasting protocols can enhance the efficiency within the GIG and reduce some of the long-haul communications burdens…”
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