Search Results - "Grimaila, M.R"
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Defect-oriented testing and defective-part-level prediction
Published in IEEE design & test of computers (01-01-2001)“…After an integrated circuit (IC) design is complete, but before first silicon arrives from the manufacturing facility, the design team prepares a set of test…”
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2
Improving Satellite Multicast Security Scalability by Reducing Rekeying Requirements
Published in IEEE network (01-07-2007)“…As multicasting technologies grow in popularity, so does the need for scalable security architectures to support the user base. Significant research efforts…”
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Journal Article -
3
Enterprise computing: economies and diseconomies of scale in server price/performance relationships
Published in IEEE transactions on engineering management (01-08-2005)“…It has been long held that computer systems exhibit economies of scale (Grosch's law) and that their price increases with performance, but at a decreasing…”
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4
Maximizing business information security's educational value
Published in IEEE security & privacy (01-01-2004)“…A business information security course's goals and objectives are quite different from most traditional security courses, which focus on designing and…”
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Magazine Article -
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An Enterprise Level Security Requirements Specification Model
Published in Proceedings of the 38th Annual Hawaii International Conference on System Sciences (2005)“…A formal model of security requirements for enterprise information technology protection is developed. The model is based on set theory and represented using…”
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Conference Proceeding -
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An optimal test pattern selection method to improve the defect coverage
Published in IEEE International Conference on Test, 2005 (2005)“…It is well known that n-detection test sets are effective to detect unmodeled defects and improve the defect coverage. However, in these sets, each of the…”
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Conference Proceeding -
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REDO-random excitation and deterministic observation-first commercial experiment
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)“…For many years, non-target detection experiments have been simulated by using AND/OR bridges or gross delay faults as surrogates. For example, the defective…”
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Conference Proceeding -
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A new ATPG algorithm to limit test set size and achieve multiple detections of all faults
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 04-08 Mar. 2002 (2002)“…Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple…”
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Conference Proceeding -
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Improving the Global Information Grid's Performance through Satellite Communications Layer Enhancements
Published in IEEE communications magazine (01-11-2006)“…With the information age in full and rapid development, users are becoming accustomed to having immediate access to information. Users demand more capabilities…”
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Magazine Article -
10
Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D
Published in Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) (2000)“…Predicting the final value of the defective part level after the application of a set of test vectors is not a simple problem. In order for the defective part…”
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Conference Proceeding -
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Towards an Information Asset-Based Defensive Cyber Damage Assessment Process
Published in 2007 IEEE Symposium on Computational Intelligence in Security and Defense Applications (01-04-2007)“…The use of computers and communication technologies to enhance command and control (C2) processes has yielded enormous benefits in military operations…”
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Conference Proceeding -
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On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction
Published in Proceedings - Asian Test Symposium (2000)“…Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect…”
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Conference Proceeding Journal Article -
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Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies
Published in International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) (1999)“…If many potential defects exist at each site in an integrated circuit, then as the number of applied test patterns increases, the number of defects which…”
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Conference Proceeding -
14
A macromodel fault generator for cellular neural networks
Published in Proceedings of the Third IEEE International Workshop on Cellular Neural Networks and their Applications (CNNA-94) (1994)“…A CAD tool based on SPICE macromodels to simulate simplified faulty, circuit realizations of a fully programmable, two dimensional cellular neural network…”
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Conference Proceeding -
15
Robust functional testing for VLSI cellular neural network implementations
Published in IEEE transactions on circuits and systems. 1, Fundamental theory and applications (01-02-1997)“…A robust testing method for detecting circuit faults within two-dimensional Cellular Neural Network (CNN) arrays is presented. The functional tests consist of…”
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Journal Article -
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Improving the Global Information Grid¿s Performance through Satellite Communications Layer Enhancements
Published in IEEE communications magazine (01-11-2006)“…[...] we show how multicasting protocols can enhance the efficiency within the GIG and reduce some of the long-haul communications burdens…”
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Magazine Article