Search Results - "Grigoryev, D. V."

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    Distribution of the surface potential of epitaxial HgCdTe by Novikov, V. A., Grigoryev, D. V., Bezrodnyy, D. A., Dvoretsky, S. A.

    Published in Applied physics letters (08-09-2014)
    “…We studied the distribution of surface potential of the Hg1−xCdxTe epitaxial films grown by molecular beam epitaxy. The studies showed that the variation of…”
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    Electrical Properties of the V-Defects of Epitaxial HgCdTe by Novikov, V. A., Grigoryev, D. V., Bezrodnyy, D. A., Voitsekhovskii, A. V., Dvoretsky, S. A., Mikhailov, N. N.

    Published in Journal of electronic materials (01-07-2017)
    “…The manufacturing process of wide-band-gap matrix photodetector devices and miniaturization of their individual pixels gave rise to increased demands on the…”
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    Investigation of the surface-potential distribution of epitaxial CdHgTe films by Novikov, V. A., Grigoryev, D. V., Voitsekhovskii, A. V., Dvoretsky, S. A., Mikhailov, N. N.

    “…The epitaxial growth of CdHgTe films is accompanied by the formation of V defects whose density and electronic properties greatly affect the characteristics of…”
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    The blue vibronically resolved electroluminescence of azatrioxa[8]circulene by Valiev, R.R., Gadirov, R.M., Degtyarenko, K.M., Grigoryev, D.V., Nasubullin, R.T., Baryshnikov, G.V., Minaev, B.F., Pedersen, S.K., Pittelkow, M.

    Published in Chemical physics letters (01-10-2019)
    “…[Display omitted] •The blue OLED device is fabricated.•The vibronic spectrum of dye is simulated.•The vibronic analysis of electroluminescence spectrum is…”
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    Investigation of surface potential in the V-defect region of MBE Cd{sub x}Hg{sub 1−x}Te film by Novikov, V. A., Grigoryev, D. V.

    Published in Semiconductors (Woodbury, N.Y.) (15-03-2015)
    “…Atomic-force microscopy is used to investigate the distribution of the contact-potential difference (surface potential) in Cd{sub x}Hg{sub 1−x}Te epitaxial…”
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    Investigation of surface potential in the V-defect region of MBE CdxHg1 − xTe film by Novikov, V. A., Grigoryev, D. V.

    Published in Semiconductors (Woodbury, N.Y.) (2015)
    “…Atomic-force microscopy is used to investigate the distribution of the contact-potential difference (surface potential) in Cd x Hg 1 − x Te epitaxial films…”
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    Calculation of thermal parameters of SiGe microbolometers by Voitsekhovskii, A. V, Grigoryev, D. V, Yuryev, V. A, Nesmelov, S. N

    Published 30-08-2012
    “…Russian Physics Journal, Vol. 50, No. 12, 2007, p. 1218 The thermal parameters of a SiGe microbolometer were calculated using numerical modeling. The…”
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