Search Results - "Gri, M."

Second Harmonic Generation: A Non-Destructive Characterization Method for Dielectric-Semiconductor Interfaces by Ionica, I., Damianos, D., Kaminski-Cachopo, A., Bouchard, A., Mescot, X, Gri, M., Grosa, G., Cristoloveanu, S., Vitrant, G., Blanc-Pelissier, D., Lei, M., Chanzala, J.

“…This paper reviews the application of second harmonic generation (SHG) to characterize dielectric-semiconductor interfaces used in microelectronics and…”
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A new lifetime characterization technique using drain current transients in SOI material by Ionescu, A.M, Cristoloveanu, S, Munteanu, D, Elewa, T, Gri, M

“…A new technique based on the transient operation of the pseudo-MOS transistor is proposed for direct evaluation of generation lifetime and surface velocity in…”
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Plasmonic nanospheres with a handle—Local electrochemical deposition of Au or Ag at the apex of optically inactive W- or C-tips by Ma, X., Grüßer, M., Schuster, R.

“…We developed an electrochemical method for the local deposition of spherical particles of plasmonic metals like Au or Ag at the apex of conductive tips. The…”
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