Search Results - "Gravot, V."
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Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuits
Published in IEEE journal of solid-state circuits (01-11-2002)“…This paper describes substrate noise reduction techniques for synchronous CMOS circuits. Low-noise digital design techniques have been implemented and measured…”
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Journal Article -
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Digital circuit capacitance and switching analysis for ground bounce in ICs with a high-ohmic substrate
Published in ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705) (2003)“…Ground bounce is a major contributor to substrate noise generation due to the resonance caused by the inductance and the VDD-VSS admittance that consists of…”
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Conference Proceeding -
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A harmonic quadrature LO generator using a 90/spl deg/ delay-locked loop [zero-IF transceiver applications]
Published in Proceedings of the 30th European Solid-State Circuits Conference (2004)“…To overcome problems with DC-offsets and LO pulling in zero-IF transceivers, a technique is presented to generate quadrature LO signals from an oscillator…”
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Conference Proceeding -
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High-level simulation of substrate noise generation from large digital circuits with multiple supplies
Published in Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 (2001)“…Substrate noise generated by large digital circuits degrades the performance of analog circuits sharing the same substrate. Existing approaches usually extract…”
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Conference Proceeding -
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Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuits
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)“…An efficient substrate-noise-reduction technique for synchronous CMOS circuits shows >2/spl times/ noise reduction with penalties of 3% area and 4% power…”
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Conference Proceeding -
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High-level simulation of substrate noise generation from large digital circuits with multiple supplies
Published in Proceedings of the conference on Design, automation and test in Europe (13-03-2001)Get full text
Conference Proceeding -
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