Search Results - "Gorbunov, M. S"

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  1. 1

    Determining the Induction Motor Degradation State Based on Rundown Characteristics by Lisov, A. A., Chernova, T. A., Gorbunov, M. S.

    Published in Measurement techniques (01-06-2019)
    “…This paper proposes the criteria for estimating the operational condition of an induction motor, determining a degree of its degradation wear, and predicting a…”
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    Journal Article
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    On board electronic devices safety provided by DICE-based Muller C-elements by Danilov, I.A., Gorbunov, M.S., Shnaider, A.I., Balbekov, A.O., Rogatkin, Y.B., Bobkov, S.G.

    Published in Acta astronautica (01-09-2018)
    “…Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic…”
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    Journal Article
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    Statistics and methodology of multiple cell upset characterization under heavy ion irradiation by Zebrev, G.I., Gorbunov, M.S., Useinov, R.G., Emeliyanov, V.V., Ozerov, A.I., Anashin, V.S., Kozyukov, A.E., Zemtsov, K.S.

    “…Mean and partial cross-section concepts and their connections to multiplicity and statistics of multiple cell upsets (MCUs) in highly-scaled digital memories…”
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    Journal Article
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    Contribution of bremsstrahlung of free electrons to formation of the background component for NaK X-ray fluorescence by Pavlinsky, G. V., Gorbunov, M. S., Vladimirova, L. I.

    Published in X-ray spectrometry (01-07-2012)
    “…Bremsstrahlung of free electrons (photo, Auger and Compton electrons) that occur in an irradiated sample is compared with probable components of the radiation…”
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    Journal Article
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    An estimation of the signal-to-background ratio, limited by radiation and electron transport in EDXRF by Portnoy, A. Yu, Pavlinsky, G. V., Gorbunov, M. S.

    Published in X-ray spectrometry (01-01-2010)
    “…A mathematical model for an energy‐dispersive X‐ray spectrometer is proposed, which is based on the analysis of the radiation transport in a sample and in a…”
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    Journal Article
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    Design of fault-tolerant microprocessors for space applications by Gorbunov, M.S.

    Published in Acta astronautica (01-10-2019)
    “…We discuss the main design concepts for fault-tolerant microprocessors, Instruction Set Architectures (ISA) of microprocessors for space applications and the…”
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    Journal Article
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    Local structure, thermodynamics, and melting curve of boron phosphide at high pressures by deep learning-driven ab initio simulations by Chtchelkatchev, N. M, Ryltsev, R. E, Magnitskaya, M. V, Gorbunov, S. M, Cherednichenko, K. A, Solozhenko, V. L, Brazhkin, V. V

    Published 11-05-2023
    “…Journal of Chemical Physics, 159 [6] 064507 (2023) Boron phosphide (BP) is a (super)hard semiconductor constituted of light elements, which is promising for…”
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    Journal Article
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    Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach by Zebrev, G. I., Zemtsov, K. S., Useinov, R. G., Gorbunov, M. S., Emeliyanov, V. V., Ozerov, A. I.

    “…We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets (MCU) in the nanoscale…”
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    Conference Proceeding
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    An estimation of EDXRF spectrometer properties, based on a two-layer composite Si-Ge detector by Portnoy, A. Yu, Pavlinsky, G. V., Gorbunov, M. S., Sidorova, Yu. I.

    Published in X-ray spectrometry (01-09-2012)
    “…A mathematical model for the two‐layer composite Si‐Ge energy dispersive X‐ray detector is proposed, based on analyses of radiation and electron transport in…”
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    Journal Article
  10. 10

    Verilog-A Modeling of Radiation-Induced Mismatch Enhancement by Gorbunov, M S, Danilov, I A, Zebrev, G I, Osipenko, P N

    Published in IEEE transactions on nuclear science (01-06-2011)
    “…Physical model of TID effects is embedded into BSIM3v3 model implemented using Verilog-A. Radiation-induced mismatch enhancement due to the combined action of…”
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    Journal Article
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    Formation of the background component of the analytical signal in the long-wavelength region of X-ray fluorescence spectrum by Pavlinskii, G. V., Gorbunov, M. S., Vladimirova, L. I.

    “…Components of X-ray background in the long-wavelength spectral region of a crystal diffraction X-ray fluorescence spectrometer were calculated. The…”
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    Journal Article
  12. 12

    A MOS Temperature-Insensitive Voltage Divider and Its Application for Voltage Reference Design by Danilov, I. A., Gorbunov, M. S., Nikiforov, A. Y.

    “…We propose a MOS temperature-insensitive voltage divider circuit. The circuit works well in both weak inversion and strong inversion modes. The temperature…”
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    Conference Proceeding
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    Estimation of the properties of an energy-dispersive X-ray fluorescence spectrometer based on a composite double-layer detector by Portnoi, A. Yu, Pavlinskii, G. V., Gorbunov, M. S., Sidorova, Yu. I.

    “…A mathematical model of double-layer Si-Ge and Si-AsGa energy-dispersive detectors of X-rays based on the analysis of processes of radiation and electron…”
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    Journal Article
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    Bremsstrahlung of the free electrons arising in an irradiated specimen by Pavlinskii, G. V., Gorbunov, M. S., Portnoi, A. Yu

    Published in Russian physics journal (01-07-2009)
    “…A model of the bremsstrahlung produced by photoelectrons, Auger electrons, and Compton electrons arising in an irradiated specimen is proposed. Calculations…”
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    Journal Article
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    Optimization of the signal-to-background ratio in energy-dispersive X-ray fluorescence analysis using a Si(Li) detector by Portnoi, A. Yu, Pavlinskii, G. V., Gorbunov, M. S., Baranov, E. O., Zuzaan, P.

    “…A mathematical model of an energy dispersive X-ray fluorescence spectrometer is discussed based on the analysis of the processes of radiation transport in the…”
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    Journal Article
  17. 17

    Modeling of Radiation-Induced Leakage and Low Dose-Rate Effects in Thick Edge Isolation of Modern MOSFETs by Zebrev, G.I., Gorbunov, M.S.

    Published in IEEE transactions on nuclear science (01-08-2009)
    “…A procedure of SPICE parameters extraction for radiation-induced equivalent lumped parasitic transistor is proposed. Comparison of radiation-induced leakage…”
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    Journal Article
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    SPICE-level layout-aware single event effects simulation of majority voters by Balbekov, A. O., Gorbunov, M. S., Zebrev, G. I.

    “…We present the simulation results comparing the upset sensitivity of different types of the majority voters. We conducted the SPICE-level simulations by means…”
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    Conference Proceeding
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