Search Results - "Gomès, Séverine"

Scanning thermal microscopy: A review by Gomès, Séverine, Assy, Ali, Chapuis, Pierre-Olivier

“…Fundamental research and continued miniaturization of materials, components and systems have raised the need for the development of thermal‐investigation…”
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Heat transfer at nanoscale contacts investigated with scanning thermal microscopy by Assy, Ali, Gomès, Séverine

“…This article investigates heat transfer at nanoscale contacts through scanning thermal microscopy (SThM) under vacuum conditions. Measurements were performed…”
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Thermal boundary conductance of CVD-grown MoS2 monolayer-on-silica substrate determined by scanning thermal microscopy by Frausto-Avila, Christian Mateo, Arellano-Arreola, Victor M., Yañez Limon, Jose Martin, De Luna-Bugallo, Andres, Gomès, Séverine, Chapuis, Pierre-Olivier

“…We characterize heat dissipation of supported molybdenum disulfide (MoS2) monolayers grown by chemical vapor deposition by means of ambient-condition scanning…”
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Local Heat Dissipation and Elasticity of Suspended Silicon Nanowires Revealed by Dual Scanning Electron and Thermal Microscopies by Sojo‐Gordillo, Jose M., Gadea‐Diez, Gerard, Renahy, David, Salleras, Marc, Duque‐Sierra, Carolina, Vincent, Pascal, Fonseca, Luis, Chapuis, Pierre‐Olivier, Morata, Alex, Gomès, Séverine, Tarancón, Albert

“…A novel combined setup, with a scanning thermal microscope (SThM) embedded in a scanning electron microscope (SEM), is used to characterize a suspended silicon…”
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Interfacial thermal resistance between nanoconfined water and silicon: Impact of temperature and silicon phase by Gonçalves, William, Isaiev, Mykola, Lacroix, David, Gomès, Séverine, Termentzidis, Konstantinos

“…Molecular dynamics simulations are used to investigate the interfacial thermal resistance (Kapitza resistance) between crystalline or amorphous silicon and…”
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Microfabricated sensor platform with through-glass vias for bidirectional 3-omega thermal characterization of solid and liquid samples by Grosse, Corinna, Abo Ras, Mohamad, Varpula, Aapo, Grigoras, Kestutis, May, Daniel, Wunderle, Bernhard, Chapuis, Pierre-Olivier, Gomès, Séverine, Prunnila, Mika

“…•3-omega method platform for thermal conductivity and diffusivity measurements.•Measurements of small liquid and solid volumes with low heating powers are…”
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Erratum: “Heat transfer at nanoscale contacts investigated with scanning thermal microscopy” [Appl. Phys. Lett. 107 , 043105 (2015)] by Assy, Ali, Gomès, Séverine

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SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis by Guen, Eloise, Klapetek, Petr, Puttock, Robert, Hay, Bruno, Allard, Alexandre, Maxwell, Tony, Chapuis, Pierre-Olivier, Renahy, David, Davee, Guillaume, Valtr, Miroslav, Martinek, Jan, Kazakova, Olga, Gomès, Séverine

“…We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of…”
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Thermal conductivity of partially amorphous porous silicon by photoacoustic technique by Isaiev, Mykola, Newby, Pascal J., Canut, Bruno, Tytarenko, Alona, Lishchuk, Pavlo, Andrusenko, Dmytro, Gomès, Séverine, Bluet, Jean-Marie, Fréchette, Luc G., Lysenko, Vladimir, Burbelo, Roman

“…In this paper, thermal transport properties study of partially amorphous porous silicon obtained by irradiation with swift (110MeV) uranium ions is reported. A…”
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Impact of roughness on heat conduction involving nanocontacts by Guen, Eloïse, Chapuis, Pierre-Olivier, Kaur, Nupinder Jeet, Klapetek, Petr, Gomés, Séverine

“…The impact of surface roughness on conductive heat transfer across nanoscale contacts is investigated by means of scanning thermal microscopy. Silicon surfaces…”
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Investigation of the thermal conductivity enhancement mechanism of polymer composites with carbon-based fillers by scanning thermal microscopy by Sun, Wenxiang, Hamaoui, Georges, Micusik, Matej, Evgin, Tuba, Vykydalova, Anna, Omastova, Maria, Gomés, Séverine

“…In order to elucidate the mechanism of enhancement of heat transfer in polymer composites, in this work, we investigated two types of polymer-carbon filler…”
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Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy by Gomès, Séverine, Newby, Pascal, Canut, Bruno, Termentzidis, Konstantinos, Marty, Olivier, Fréchette, Luc, Chantrenne, Patrice, Aimez, Vincent, Bluet, Jean-Marie, Lysenko, Vladimir

“…This paper reports on the abilities of a Scanning Thermal Microscopy (SThM) method to characterize the thermal conductivity of insulating materials and thin…”
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Thermal boundary conductance of CVD-grown MoS 2 monolayer-on-silica substrate determined by scanning thermal microscopy by Frausto-Avila, Christian Mateo, Arellano-Arreola, Victor, Yañez Limon, Jose Martin, de Luna-Bugallo, Andres, Gomès, Séverine, Chapuis, Pierre-Olivier

“…We characterize heat dissipation of supported molybdenum disulfide (MoS 2 ) monolayers grown by chemical vapor deposition by means of ambient-condition…”
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Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors by Assy, Ali, Gomès, Séverine, Chantrenne, Patrice, Pavy, Nicolas, Parasuraman, Jayalakshmi, Kleber, Xavier, Basset, Philippe

“…The measurement of thermal properties of solid materials at different temperatures above ambient is investigated using a set of microresistors. Samples…”
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A.C. scanning thermal microscopy: Tip–sample interaction and buried defects modellings by Gomès, Séverine, Trannoy, Nathalie, Depasse, Françoise, Grossel, Philippe

“…Modellings describing the different thermal interactions between a sample surface and a probe in case of modulated heated probe are given and analysed. To…”
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Scanning thermal microscopy: A review: Scanning thermal microscopy by Gomès, Séverine, Assy, Ali, Chapuis, Pierre-Olivier

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Ion implantation effects on the microstructure, electrical resistivity and thermal conductivity of amorphous CrSi2 thin films by Timm, M. M., Oliviero, E., Sun, W., Gomes, S., Hamaoui, G., Fichtner, P. F. P., Frety, N.

“…The microstructural changes induced by ion implantation may lead to advantageous modifications of chromium disilicide's (CrSi 2 ) electrical and thermal…”
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Thickness-dependent thermal properties of amorphous insulating thin films measured by photoreflectance microscopy by Al Mohtar, A., Tessier, G., Ritasalo, R., Matvejeff, M., Stormonth-Darling, J., Dobson, P.S., Chapuis, P.O., Gomès, S., Roger, J.P.

“…In this work, we report on the measurement of the thermal conductivity of thin insulating films of SiO2 obtained by thermal oxidation, and Al2O3 grown by…”
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QUANTIHEAT project: Main progresses by Gomés, Séverine, Heat, Quanti

“…The development of increasingly complex and nanostructured materials and devices, for example thermoelectric materials, nanocomposite polymers or micro- and…”
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Temperature Study of Sub-Micrometric ICs by Scanning Thermal Microscopy by Gomes, S., Chapuis, P.-O., Nepveu, F., Trannoy, N., Volz, S., Charlot, B., Tessier, G., Dilhaire, S., Cretin, B., Vairac, P.

“…Surface temperature measurements were performed with a scanning thermal microscope mounted with a thermoresistive wire probe of micrometric size. A CMOS device…”
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