Search Results - "Golo, Natasa Tosic"

Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors by Golo, N.T., Kuper, F.G., Mouthaan, T.J.

“…Electrical breakdown induced by systematic electrostatic discharge (ESD) stress of thin-film transistors used as switches in active matrix addressed liquid…”
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Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors by Golo, Natasa Tosic, van der Wal, Siebrigje, Kuper, Fred G., Mouthaan, Ton

“…The objective of this letter is to give an estimation of the impact of an electrostatic discharge (ESD) stress on the density of states (DOS) within the energy…”
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