Search Results - "Gladstone, S.M."
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Limitations on oxide thicknesses in flash EEPROM applications
Published in Proceedings of International Reliability Physics Symposium (1996)“…Oxides used in EEPROMs have severe limitations placed on leakage currents due to long data retention time requirements. During write/erase (W/E) cycling,…”
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Conference Proceeding
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Thickness dependence of stress-induced leakage currents in silicon oxide
Published in IEEE transactions on electron devices (01-06-1997)“…The thickness dependence of high-voltage stress-induced leakage currents (SILC's) has been measured in oxides with thicknesses between 5 and 11 nm. The SILC's…”
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Journal Article -
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Effect of period and level of infestation of the fall armyworm, Spodoptera frugiperda, on irrigated maize yield
Published in The Florida entomologist (01-09-1988)“…The effect of period and level of infestation by the fall armyworm (FAW), Spodoptera frugiperda (J. E. Smith) (Lepidoptera: Noctuidae), on irrigated maize, Zea…”
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Journal Article Conference Proceeding -
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Thickness dependence of low-level leakages in thin oxides
Published in Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits (1995)“…The wearout of 4 nm to 13 nm thick oxides fabricated on n-type and p-type substrates was measured. The interface trap densities, flatband voltage shifts, bulk…”
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Conference Proceeding -
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Epidemic roller coaster: maize stunt disease in Nicaragua
Published in American entomologist (Lanham, Md.) (01-12-1996)Get full text
Magazine Article