Search Results - "Giessibl, F. J"

High-precision atomic force microscopy with atomically-characterized tips by Liebig, A, Peronio, A, Meuer, D, Weymouth, A J, Giessibl, F J

“…Traditionally, atomic force microscopy (AFM) experiments are conducted at tip-sample distances where the tip strongly interacts with the surface. This…”
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Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature by Huber, F, Matencio, S, Weymouth, A J, Ocal, C, Barrena, E, Giessibl, F J

“…Scanning probe microscopy can be used to probe the internal atomic structure of flat organic molecules. This technique requires an unreactive tip and has,…”
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A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data by Seeholzer, T, Gretz, O, Giessibl, F J, Weymouth, A J

“…One mode of atomic force microscopy (AFM) is frequency-modulation AFM, in which the tip is driven to oscillate at its resonance frequency which changes as the…”
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Phantom force induced by tunneling current: a characterization on Si(111) by Weymouth, A J, Wutscher, T, Welker, J, Hofmann, T, Giessibl, F J

“…Simultaneous measurements of tunneling current and atomic forces provide complementary atomic-scale data of the electronic and structural properties of…”
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Atomic structure affects the directional dependence of friction by Weymouth, A J, Meuer, D, Mutombo, P, Wutscher, T, Ondracek, M, Jelinek, P, Giessibl, F J

“…Friction between two objects can be understood by the making, stretching, and breaking of thousands of atomic-scale asperities. We have probed single atoms in…”
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A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy by Giessibl, F. J.

“…Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the…”
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Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite by HEMBACHER, S, GIESSIBL, F. J, MANNHART, J, QUATE, C. F

“…Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly…”
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The effect of sample resistivity on Kelvin probe force microscopy by Weymouth, A J, Giessibl, F J

“…Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption…”
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Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy by Giessibl, Franz J.

“…Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces…”
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Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111) by Gretz, O., Weymouth, A. J., Giessibl, F. J.

“…We investigated the atomic structure of metal tips by scanning individual CO molecules adsorbed on Pt(111) using scanning tunneling microscopy (STM) and…”
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Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum by Hembacher, S., Giessibl, F.J., Mannhart, J.

“…The noise performance of the force sensor is crucial for optimizing the resolution in non-contact atomic force microscopy. Sensing forces in vacuum and low…”
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Image correction for atomic force microscopy images with functionalized tips by Neu, M., Moll, N., Gross, L., Meyer, G., Giessibl, F. J., Repp, J.

“…It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image…”
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Subatomic Features on the Silicon (111)-(7 x 7) Surface Observed by Atomic Force Microscopy by Giessibl, Franz J., Hembacher, S., Bielefeldt, H., Mannhart, J.

“…The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range…”
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Simultaneous current-, force-, and work-function measurement with atomic resolution by Herz, M., Schiller, Ch, Giessibl, F. J., Mannhart, J.

“…The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method…”
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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy by Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan, Mannhart, Jochen

“…True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging…”
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Searching atomic spin contrast on nickel oxide (001) by force microscopy by Schmid, M., Mannhart, J., Giessibl, F. J.

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A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics by Bielefeldt, Hartmut, Giessibl, Franz J.

“…The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For…”
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Advances in atomic force microscopy by Giessibl, Franz J.

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Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy by GIESSIBL, F. J

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qPlus Magnetic Force Microscopy in Frequency-Modulation Mode with milli-Hertz Resolution by Schneiderbauer, M, Giessibl, F. J

“…Beilstein J. Nanotechnol. 3, 174-178 (2012) Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the…”
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