Measurement of femtometre-scale atomic displacements by X-ray absorption spectroscopy
The frequencies of extended X-ray absorption fine-structure (EXAFS) measurements, which are oscillations occurring on the high-energy side of an X-ray absorption edge, can be used to identify interatomic distances in materials. We have used a dispersive X-ray spectrometer, which has no moving compon...
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Published in: | Nature Vol. 435; no. 7038; pp. 78 - 81 |
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Main Authors: | , , , , |
Format: | Journal Article |
Language: | English |
Published: |
London
Nature Publishing
05-05-2005
Nature Publishing Group |
Subjects: | |
Online Access: | Get full text |
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Summary: | The frequencies of extended X-ray absorption fine-structure (EXAFS) measurements, which are oscillations occurring on the high-energy side of an X-ray absorption edge, can be used to identify interatomic distances in materials. We have used a dispersive X-ray spectrometer, which has no moving components, to make rapid measurements with minimal energy drift of the difference in EXAFS from the Fe K edge in an iron-cobalt thin film undergoing periodic strain through magnetostriction. We show that magnetostriction can be detected by differential X-ray absorption. The magnitude of the recorded signal relative to the noise shows a sensitivity to mean differential atomic motion of one femtometre: a factor of 100 times more sensitive than that normally available. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 ObjectType-Article-2 ObjectType-Feature-1 |
ISSN: | 0028-0836 1476-4687 |
DOI: | 10.1038/nature03516 |