Measurement of femtometre-scale atomic displacements by X-ray absorption spectroscopy

The frequencies of extended X-ray absorption fine-structure (EXAFS) measurements, which are oscillations occurring on the high-energy side of an X-ray absorption edge, can be used to identify interatomic distances in materials. We have used a dispersive X-ray spectrometer, which has no moving compon...

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Bibliographic Details
Published in:Nature Vol. 435; no. 7038; pp. 78 - 81
Main Authors: Pettifer, Robert F, Mathon, Olivier, Pascarelli, Sakura, Cooke, Michael D, Gibbs, Michael R. J
Format: Journal Article
Language:English
Published: London Nature Publishing 05-05-2005
Nature Publishing Group
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Summary:The frequencies of extended X-ray absorption fine-structure (EXAFS) measurements, which are oscillations occurring on the high-energy side of an X-ray absorption edge, can be used to identify interatomic distances in materials. We have used a dispersive X-ray spectrometer, which has no moving components, to make rapid measurements with minimal energy drift of the difference in EXAFS from the Fe K edge in an iron-cobalt thin film undergoing periodic strain through magnetostriction. We show that magnetostriction can be detected by differential X-ray absorption. The magnitude of the recorded signal relative to the noise shows a sensitivity to mean differential atomic motion of one femtometre: a factor of 100 times more sensitive than that normally available.
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ISSN:0028-0836
1476-4687
DOI:10.1038/nature03516