Near-field polarization distribution of Si nanoparticles near substrate

Structure of the near-field intensity and polarization distributions, the latter is described with the generalized 3D Stokes parameters, of a spherical Si subwavelength nanoparticle in a non-magnetic and non-absorbing media near a dielectric substrate has been studied in detail with the help of the...

Full description

Saved in:

Bibliographic Details
Published in:	EPJ Web of Conferences Vol. 132; p. 3006
Main Authors:	Reshetov, S.A., Vladimirova, Yu.V., Gevorkian, L.P., Zadkov, V.N.
Format:	Journal Article Conference Proceeding
Language:	English
Published:	Les Ulis EDP Sciences 2017
Subjects:	Dielectric properties Mie scattering Nanoparticles Polarization Silicon substrates Stokes parameters
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

Description
Summary:	Structure of the near-field intensity and polarization distributions, the latter is described with the generalized 3D Stokes parameters, of a spherical Si subwavelength nanoparticle in a non-magnetic and non-absorbing media near a dielectric substrate has been studied in detail with the help of the Mie theory and an extension of the Weyl's method for the calculation of the reflection of dipole radiation by a flat surface. It is shown that for the nanoparticle near the substrate the interference effects due to the scattering by the nanoparticle and interaction with the substrate play an essential role. We also demonstrate how these effects depend on the dielectric properties of the nanoparticle, its size, distance to the substrate as well as on the polarization, wavelength and incident angle of the external light field.
ISSN:	2100-014X 2101-6275 2100-014X
DOI:	10.1051/epjconf/201713203006