Search Results - "Gertner, E R"

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    Growth and doping of GaAsSb via metalorganic chemical vapor deposition for InP heterojunction bipolar transistors by McDermott, B. T., Gertner, E. R., Pittman, S., Seabury, C. W., Chang, M. F.

    Published in Applied physics letters (04-03-1996)
    “…GaAsSb is a low band gap, lattice matched to InP, alternative to GaInAs. Growth and doping using diethyltellurium and carbon tetrachloride were investigated…”
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    Journal Article
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    p‐type arsenic doping of CdTe and HgTe/CdTe superlattices grown by photoassisted and conventional molecular‐beam epitaxy by Arias, J. M., Shin, S. H., Cooper, D. E., Zandian, M., Pasko, J. G., Gertner, E. R., DeWames, R. E., Singh, J.

    “…In this paper we report on p‐type arsenic doping of CdTe and HgTe/CdTe superlattices by photoassisted and conventional molecular‐beam epitaxy (MBE). We also…”
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    Journal Article
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    Infrared diodes fabricated with HgCdTe grown by molecular beam epitaxy on GaAs substrates by ARIAS, J. M, DEWAMES, R. E, SHIN, S. H, PASKO, J. G, CHEN, J. S, GERTNER, E. R

    Published in Applied physics letters (13-03-1989)
    “…Infrared photodiodes fabricated with HgCdTe epilayers grown on GaAs substrates by molecular beam epitaxy (MBE) are reported here for the first time. Growth was…”
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    Journal Article
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    Modification of GaN Schottky barrier interfaces probed by ballistic-electron-emission microscopy and spectroscopy by Bell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J.

    Published in Applied physics letters (27-03-2000)
    “…Ballistic-electron-emission microscopy (BEEM) and spectroscopy have been used to investigate the properties of Au/GaN interfaces. The effects of in situ and ex…”
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    Journal Article
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    Ion Implantation Study of HgCdTe by Bubulac, L. O., Tennant, W. E., Shin, S. H., Wang, C. C., Lanir, M., Gertner, E. R., Marshall, E. D.

    Published in Japanese Journal of Applied Physics (01-01-1980)
    “…Light atom species, such as Li, Mg, B, Be, Cl, F and Al implanted in bulk and epitaxial HgCdTe of compositions from 3 to 12 µm cut-off yielded n/p junctions…”
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    Journal Article
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    Metal/GaN Schottky barriers characterized by ballistic-electron-emission microscopy and spectroscopy by Bell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J.

    “…Ballistic-electron-emission microscopy (BEEM) and spectroscopy have been used to characterize the Pd/GaN and Au/GaN interfaces. BEEM spectra yield a Schottky…”
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    Conference Proceeding
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    Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces by Bell, L. D., Smith, R. P., McDermott, B. T., Gertner, E. R., Pittman, R., Pierson, R. L., Sullivan, G. J.

    Published in Applied physics letters (30-03-1998)
    “…Ballistic-electron-emission microscopy (BEEM) spectroscopy and imaging have been applied to the Au/GaN interface. In contrast to previous BEEM measurements,…”
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    Journal Article
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    Backside-illuminated InAsSb/GaSb broadband detectors by Bubulac, L. O., Andrews, A. M., Gertner, E. R., Cheung, D. T.

    Published in Applied physics letters (01-05-1980)
    “…This letter reports the achievement of a high-performance, broad-spectral-band infrared detector with the InAs1−xSbx alloy system using a backside-illuminated…”
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    Journal Article
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    Backside−illuminated Pb1−xSnxTe heterojunction photodiode by Andrews, A. M., Longo, J. T., Clarke, J. E., Gertner, E. R.

    Published in Applied physics letters (15-04-1975)
    “…The need for a long−wavelength infrared detector that makes more efficient use of the available radiation has led us to construct a backside−illuminated…”
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    Journal Article
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    p‐type doping of metalorganic chemical vapor deposition‐grown HgCdTe by arsenic and antimony by Edwall, D. D., Bubulac, L. O., Gertner, E. R.

    “…Extensive data are presented on the arsenic doping characteristics of Hg1−x Cd x Te layers grown by metalorganic chemical vapor deposition using the dopant…”
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    Conference Proceeding
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    Cathodoluminescence of HgCdTe and CdTe on CdTe and sapphire by Bubulac, L. O., Tennant, W. E., Edwall, D. D., Gertner, E. R., Robinson, J. C.

    “…The imaging cathodoluminescence capability of a scanning electron microscope (SEM) was complemented by etch pit (EP) measurements and secondary ion mass…”
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    Journal Article