Search Results - "Gershman, Israel"
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Nondestructive Quantitative Analysis of Crack Propagation in Solder Joints
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-08-2013)“…Nondestructive quantitative analysis has been developed and can reduce solder joint fatigue experiments by half the time. Additionally, the technique provides…”
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2
Solder-Joint Quantitative Crack Analysis-Ohmic Resistance Approach
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-05-2012)“…This paper presents a novel technique in the area of solder-joint reliability testing, suggesting a new approach for efficient testing of new products. An…”
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Reliability qualification of semiconductor devices based on physics-of-failure and risk and opportunity assessment
Published in Quality and reliability engineering international (01-03-2002)“…Qualification frequently is a time‐critical activity at the end of a development project. As time‐to‐market is a competitive issue, the most efficient…”
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The efficacy of a test and ESS program
Published in Quality and reliability engineering international (01-03-2002)“…Statistical results of all the 1621 failure analyses, which cover a four‐year effort, are presented. The failure analyses were part of an elaborate test and…”
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