Assessing data remnants in modern smartphones after factory reset

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Bibliographic Details
Published in:Forensic science international. Digital investigation (Online) Vol. 46; p. 301587
Main Authors: Blankesteijn, Mattheüs B., Fukami, Aya, Geradts, Zeno.J.M.H.
Format: Journal Article
Language:English
Published: 01-09-2023
Online Access:Get full text
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Description
ISSN:2666-2817
DOI:10.1016/j.fsidi.2023.301587