Search Results - "Gelderbloms, H."

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    Applications of Focused Ion Beam (FIB) on Yeast Cell & SARS Virus by Hing, H. L., Burkhardt, C., Gnauck, P., Sally, S., Gelderbloms, H., Muranaka, Y., Kaswandi, M.A., Azizl, A.H.A., Sahalan, A.Z.

    Published in Microscopy today (01-09-2007)
    “…The focused ion beam (FIB) is a relatively novel technique to biomedical electron microscopy as it open up new means for the observations and examinations of a…”
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    Magazine Article