Search Results - "Geinzer, T."

Near-field detection of photon emission from silicon with 30 nm spatial resolution by Isakov, D., Tio, A.A.B., Geinzer, T., Phang, J.C.H., Zhang, Y., Balk, L.J.

“…We demonstrate a scanning near-field photon emission microscope (SNPEM) for monitoring photon emission sites with spatial resolution beyond the diffraction…”
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Determination of the local electric field strength by Energy dispersive Photon Emission Microscopy by Geinzer, T, Heiderhoff, R, Phang, J C H, Balk, L J

“…Energy-dispersive Photon Emission Microscopy (PEM) allows the local electron temperature distribution to be characterized with high accuracy and sensitivity…”
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Determination of the local electric field strength near electric breakdown by Geinzer, T, Heiderhoff, R, Phang, J C H, Balk, L J

“…For a detailed understanding of near electric breakdown a semiconductor device is analyzed by complementary Optical Beam Induced Current and energy-dispersive…”
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Determination of the electric field distribution within multi-quantum-well light emitting diodes by the use of electron beam induced methods by Geinzer, T., Heiderhoff, R., Balk, L.J.

“…Dynamic electron beam induced methods are applied to determine the local electrical field distribution of devices with small depletion regions. The dissipation…”
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Scanning near-field photon emission microscopy by Isakov, D., Geinzer, T., Tio, A., Phang, J.C.H., Zhang, Y., Balk, L.J.

“…A Scanning Near-field Photon Emission Microscope (SNPEM) for monitoring photon emission sites with a spatial resolution of between 50 to 200 nm is described. A…”
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Time-Resolved and Stroboscopic EBIC Analyses on Dynamically Biased Active Devices by Pugatschow, A., Geinzer, T., Heiderhoff, R., Niedernostheide, F.-J., Balk, L.J.

“…Electron beam induced current (EBIC) microscopy is applied for time-resolved and stroboscopic analyses. For the first time, it is possible to generate EBIC…”
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Dynamic Behavior of High-Power Diodes Analyzed by EBIC by Pugatschow, A., Geinzer, T., Heiderhoff, R., Niedernostheide, F.J., Schulze, H.J., Wiedenhorst, B., Balk, L.J.

“…A setup is described which allows investigations of electric field distributions in the top layers of a dynamically driven power device by means of…”
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Applications of scanning near-field photon emission microscopy by Isakov, D.V., Tan, B.W.M., Phang, J.C.H., Yeo, Y.C., Tio, A.A.B., Zhang, Y., Geinzer, T., Balk, L.J.

“…In this paper, the application of scanning near-field photon emission microscopy for imaging photon emission sites is demonstrated. Photon emissions generated…”
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